The 16th European Microscopy Congress 2016 Archives

Performance of the SALVE III corrector for EFTEM applications

Frank Kahl, Martin Linck, Peter Hartel, Heiko Mueller, Stephan Uhlemann, Max Haider, Joachim Zach
Performances of aberration-corrected monochromatic low-voltage analytical electron microscope

Masaki Mukai, Shigeyuki Morishita, Hidetaka Sawada, Kazu Suenaga
PH and concentration effect on the optical absorption properties of porphyrin nanorods functionalized graphene oxide.

Omar Bajjou, Malik Maaza, Mohammed Khenfouch, B Mothudi, M LEKALA, Mimouna Baitoul
Phase contrast transmission electron microscopy with hole-free phase plate for material analysis.

Yuji Konyuba, Hirofumi Iijima, Patricia Donnadieu, Takeshi Higuchi, Hiroshi Jinnai, Naoki Hosogi
Phase formation and growth behavior of Co-Ge thin films

Carlos Alvarez, Maxime Bertoglio, Khalid Hoummada, Alain Portavoce, Ahmed Charai
Phase identification of complex grain boundary precipitation in a high Cr and Ni superalloy upon direct-aging

Julio Cesar Spadotto, Masashi Watanabe, Jean Dille, Ivan Guillermo Solórzano
Phase mapping of 2xxx-series aluminium alloys by scanning precession electron diffraction

Jonas Kristoffer Sunde, Sigurd Wenner, Antonius T.J. van Helvoort, Duncan N. Johnstone, Paul A. Midgley, Randi Holmestad
Picometre-precision atomic structure of inversion domain boundaries in GaN

Benedikt Haas, Robert A. McLeod, Thomas Auzelle, Bruno Daudin, Joël Eymery, Frédéric Lançon, Jian-Min Zuo, Jean-Luc Rouvière
Piezoelectric thin films investigated by dark-field electron holography and in-situ biasing

Thibaud Denneulin, Nicole Wollschläger, Martin Hÿtch
Pixelated STEM detectors: opportunities and challenges

Ian MacLaren, Magnus Nord, Andrew Ross, Matus Krajnak, Martin Hart, Alastair Doye, Damien McGrouther, Rantej Bali, Archan Banerjee, Robert Hadfield
Plan view STEM analysis of the domain structure in anisotropically strained epitaxial K_0.95Na_0.05NbO₃ ferroelectric films with giant piezoelectricity

Toni Markurt, Jutta Schwarzkopf, Dorothee Braun, Martin Schmidbauer, Martin Albrecht
Plasma cleaning effect on the stability of the Epon resin sections

Radim Skoupý, Vladislav Krzyzanek, Jana Nebesarova
Plasmonic edge and breathing modes in aluminum nanotriangles

Alfredo Campos, Davy Gerard, Jerome Martin, Jerome Plain, Julien Proust, Arnaud Arbouet, Mathieu Kociak
Plasmonic Resonance in Metallic Nanoparticles

Alfredo Campos, Troc Nicolas, Hans-Christian Weissker, Odile Stéphan, Matthias Hillenkamp, Mathieu Kociak
Platinum shadowing for correlative light and electron microscopy

Jose Maria Mateos, Bruno Guhl, Jana Doehner, Gery Barmettler, Andres Kaech, Urs Ziegler
Playing around with shape and composition of nanoparticles for various applications

Magdalena Parlinska-Wojtan, Grzegorz Gruzel, Elzbieta Roga, Joanna Depciuch, Andrzej Kowal
Point defect driven ferromagnetism in YBa2Cu3O7-x superconductor

Jaume Gazquez, Roger Guzman, Rohan Mishra, Elena Bartolome, Juan Salafranca, Cesar Magen, Maria Varela, Mariona Coll, Anna Palau, S.M. Valvidares, Pierluigi Gargiani, Eric Pellegrin, Javier Herrero-Martin, S.J. Pennycook, Teresa Puig, Xavier Obradors
Polar-graded multiferroic SrMnO3 thin films

Roger Guzman, Roger Guzman, Laura Maurel, Eric Langenberg, Andrew R. Lupini, Pedro A. Algarabel, José A. Pardo, César Magén
Power of FIB-SEM Tomography for Biological Samples

Caroline Kizilyaprak, Florence Niedergang, Damien De Bellis, Willy Blanchard, Jean Daraspe, Niko Geldner, Bruno Humbel
Pre-Sertoli Cells: A Light And Electron Microscopic Study

Merve Albayrak, Özge Hürdoğan, Fadime Aktar, Ekin Kuntsal, Leyla Tapul
Precession-assisted Quasi-Parallel Illumination STEM on three condenser lenses TEMs

Sergi Plana, Joaquim Portillo, Sònia Estradé, Joan Mendoza, Francesca Peiró
Precise atomic column position measurements using ISTEM

Karel H W van den Bos, Florian F Krause, Armand Béché, Johan Verbeeck, Andreas Rosenauer, Sandra Van Aert
Precise STEM measurement of defocus and aberration in monolayer graphene

Hidetaka Sawada, Angus Kirkland
Precision and application of atom location in HAADF and ABF

Yi Wang, Dan Zhou, Wilfried Sigle, Y. Eren Suyolcu, Knut Müller-Caspary, Florian F Krause, Andreas Rosenauer, Peter van Aken
Precision top-down delayering of microelectronics devices using broad-beam argon ion milling

Pawel NOWAKOWSKI, Kristin Olexa, Mary Ray, Paul Fischione
Preparation and structural characterization of Au nanoparticles supported on metal oxide nanoplatelets for catalysis by a new two-step method.

Virginie CHEVALLIER, Véronique MADIGOU
Preparation of high fidelity holographic vortex masks using advanced FIB milling strategies

Thomas Schachinger, Andreas Steiger-Thirsfeld, Stefan Löffler, Michael Stöger-Pollach, Sebastian Schneider, Darius Pohl, Bernd Rellinghaus, Peter Schattschneider
Primary particle size distribution measurement of aggregated nanoparticles

Kazuhiro Yamamoto, Toshiyuki Fujimoto, Eric A. Grulke
Principle component analysis applied to high resolution cross sectional STEM imaging: Quantitative analysis of 2D heterostructures

Aidan Rooney, Aleksey Kozikov, Eric Prestat, Freddie Withers, Andre Geim, Konstantin Novoselov, Sarah Haigh
Probing cell behavior: Combining MEMS (microelectromechanical systems) technology with high resolution live cell imaging

Anja Geitmann
Probing localized strain in solution-derived YBCO nanocomposite films

Roger Guzman, Jaume Gazquez, Bernat Mundet, Pablo Callado, Laia Soler, Julia Jareño, Mariona Coll, Xavier Obradors, Teresa Puig
Probing structural and electronic properties of h-BN by HRTEM and STM

Ouafi Mouhoub, Christian Ricolleau, Guillaume Wang, Hakim Amara, Amandine Andrieux, Nelly Dorval, Frédéric Fossard, Pierre Lavenus, Jerome Lagoute, Van Dong Pham, Pai Woei Wu, Annick Loiseau, Damien Alloyeau
Probing the directionality of local electronic states in SrTiO3 by momentum-selected STEM-EELS

Atsushi Yamaguchi, Mitsutaka Haruta, Takashi Nemoto, Hiroki Kurata
Probing the heterogeneous nucleation interface of TiB2 in Al alloys

Jiehua Li, Fredrik Hage, Quentin Ramasse, Peter Schumacher
Probing the multiscale structure, composition and nanomechanical properties of lipids and biopolymers in natural systems: a few examples.

Cédric Gaillard
Probing the radiative and full electromagnetic local densities of states with electron energy loss spectroscopy and cathodoluminescence spectroscopy

Arthur Losquin, Mathieu Kociak
Progress in analysing lithium ion battery materials in the SEM

Christian Lang, Andy Naylor, Felix Richter, Christoph Birkl, Stefanie Zekoll, Simon Burgess, Gareth Hughes, David Howey, Peter G. Bruce
Properties of low-dimensional electron-beam-sensitive objects by spherical and chromatic aberration-corrected low-voltage high-resolution transmission electron microscopy and spectroscopy

Ute Kaiser
Proposal for an electron orbital angular momentum spectrometer

Tyler Harvey, Vincenzo Grillo, Benjamin McMorran
Prospective scintillators for low-energy BSE detectors

Ondřej Lalinský, Petr Schauer, Miroslav Kučera, Zuzana Lučeničová, Martin Hanuš
Protecting copper TEM specimens against corrosion via e-beam induced carbon deposition

Felix Seidel, Olivier Richard, Hugo Bender, Wilfried Vandervorst
Ptychographic phase reconstruction and aberration correction of STEM image using 4D dataset recorded by pixelated detector

Ryusuke Sagawa, Hao Yang, Lewys Jones, Martin Simson, Martin Huth, Heike Soltau, Peter Nellist, Yukihito Kondo
Pushing the limits of environmental scanning electron microscopy

Johannes Rattenberger, Harald Fitzek, Hartmuth Schroettner, Julian Wagner, Ferdinand Hofer