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The 16th European Microscopy Congress 2016

August 28 - September 2, 2016 in Lyon, France

View by Title View Sessions View by Presentation Form
Jump to:  View All • a b c d e f g h i j k l m n o [p] q r s t u v w x y z
  • Performance of the SALVE III corrector for EFTEM applications

    Frank Kahl, Martin Linck, Peter Hartel, Heiko Mueller, Stephan Uhlemann, Max Haider, Joachim Zach

  • Performances of aberration-corrected monochromatic low-voltage analytical electron microscope

    Masaki Mukai, Shigeyuki Morishita, Hidetaka Sawada, Kazu Suenaga

  • PH and concentration effect on the optical absorption properties of porphyrin nanorods functionalized graphene oxide.

    Omar Bajjou, Malik Maaza, Mohammed Khenfouch, B Mothudi, M LEKALA, Mimouna Baitoul

  • Phase contrast transmission electron microscopy with hole-free phase plate for material analysis.

    Yuji Konyuba, Hirofumi Iijima, Patricia Donnadieu, Takeshi Higuchi, Hiroshi Jinnai, Naoki Hosogi

  • Phase formation and growth behavior of Co-Ge thin films

    Carlos Alvarez, Maxime Bertoglio, Khalid Hoummada, Alain Portavoce, Ahmed Charai

  • Phase identification of complex grain boundary precipitation in a high Cr and Ni superalloy upon direct-aging

    Julio Cesar Spadotto, Masashi Watanabe, Jean Dille, Ivan Guillermo Solórzano

  • Phase mapping of 2xxx-series aluminium alloys by scanning precession electron diffraction

    Jonas Kristoffer Sunde, Sigurd Wenner, Antonius T.J. van Helvoort, Duncan N. Johnstone, Paul A. Midgley, Randi Holmestad

  • Picometre-precision atomic structure of inversion domain boundaries in GaN

    Benedikt Haas, Robert A. McLeod, Thomas Auzelle, Bruno Daudin, Joël Eymery, Frédéric Lançon, Jian-Min Zuo, Jean-Luc Rouvière

  • Piezoelectric thin films investigated by dark-field electron holography and in-situ biasing

    Thibaud Denneulin, Nicole Wollschläger, Martin Hÿtch

  • Pixelated STEM detectors: opportunities and challenges

    Ian MacLaren, Magnus Nord, Andrew Ross, Matus Krajnak, Martin Hart, Alastair Doye, Damien McGrouther, Rantej Bali, Archan Banerjee, Robert Hadfield

  • Plan view STEM analysis of the domain structure in anisotropically strained epitaxial K0.95Na0.05NbO3 ferroelectric films with giant piezoelectricity

    Toni Markurt, Jutta Schwarzkopf, Dorothee Braun, Martin Schmidbauer, Martin Albrecht

  • Plasma cleaning effect on the stability of the Epon resin sections

    Radim Skoupý, Vladislav Krzyzanek, Jana Nebesarova

  • Plasmonic edge and breathing modes in aluminum nanotriangles

    Alfredo Campos, Davy Gerard, Jerome Martin, Jerome Plain, Julien Proust, Arnaud Arbouet, Mathieu Kociak

  • Plasmonic Resonance in Metallic Nanoparticles

    Alfredo Campos, Troc Nicolas, Hans-Christian Weissker, Odile Stéphan, Matthias Hillenkamp, Mathieu Kociak

  • Platinum shadowing for correlative light and electron microscopy

    Jose Maria Mateos, Bruno Guhl, Jana Doehner, Gery Barmettler, Andres Kaech, Urs Ziegler

  • Playing around with shape and composition of nanoparticles for various applications

    Magdalena Parlinska-Wojtan, Grzegorz Gruzel, Elzbieta Roga, Joanna Depciuch, Andrzej Kowal

  • Point defect driven ferromagnetism in YBa2Cu3O7-x superconductor

    Jaume Gazquez, Roger Guzman, Rohan Mishra, Elena Bartolome, Juan Salafranca, Cesar Magen, Maria Varela, Mariona Coll, Anna Palau, S.M. Valvidares, Pierluigi Gargiani, Eric Pellegrin, Javier Herrero-Martin, S.J. Pennycook, Teresa Puig, Xavier Obradors

  • Polar-graded multiferroic SrMnO3 thin films

    Roger Guzman, Roger Guzman, Laura Maurel, Eric Langenberg, Andrew R. Lupini, Pedro A. Algarabel, José A. Pardo, César Magén

  • Power of FIB-SEM Tomography for Biological Samples

    Caroline Kizilyaprak, Florence Niedergang, Damien De Bellis, Willy Blanchard, Jean Daraspe, Niko Geldner, Bruno Humbel

  • Pre-Sertoli Cells: A Light And Electron Microscopic Study

    Merve Albayrak, Özge Hürdoğan, Fadime Aktar, Ekin Kuntsal, Leyla Tapul

  • Precession-assisted Quasi-Parallel Illumination STEM on three condenser lenses TEMs

    Sergi Plana, Joaquim Portillo, Sònia Estradé, Joan Mendoza, Francesca Peiró

  • Precise atomic column position measurements using ISTEM

    Karel H W van den Bos, Florian F Krause, Armand Béché, Johan Verbeeck, Andreas Rosenauer, Sandra Van Aert

  • Precise STEM measurement of defocus and aberration in monolayer graphene

    Hidetaka Sawada, Angus Kirkland

  • Precision and application of atom location in HAADF and ABF

    Yi Wang, Dan Zhou, Wilfried Sigle, Y. Eren Suyolcu, Knut Müller-Caspary, Florian F Krause, Andreas Rosenauer, Peter van Aken

  • Precision top-down delayering of microelectronics devices using broad-beam argon ion milling

    Pawel NOWAKOWSKI, Kristin Olexa, Mary Ray, Paul Fischione

  • Preparation and structural characterization of Au nanoparticles supported on metal oxide nanoplatelets for catalysis by a new two-step method.

    Virginie CHEVALLIER, Véronique MADIGOU

  • Preparation of high fidelity holographic vortex masks using advanced FIB milling strategies

    Thomas Schachinger, Andreas Steiger-Thirsfeld, Stefan Löffler, Michael Stöger-Pollach, Sebastian Schneider, Darius Pohl, Bernd Rellinghaus, Peter Schattschneider

  • Primary particle size distribution measurement of aggregated nanoparticles

    Kazuhiro Yamamoto, Toshiyuki Fujimoto, Eric A. Grulke

  • Principle component analysis applied to high resolution cross sectional STEM imaging: Quantitative analysis of 2D heterostructures

    Aidan Rooney, Aleksey Kozikov, Eric Prestat, Freddie Withers, Andre Geim, Konstantin Novoselov, Sarah Haigh

  • Probing cell behavior: Combining MEMS (microelectromechanical systems) technology with high resolution live cell imaging

    Anja Geitmann

  • Probing localized strain in solution-derived YBCO nanocomposite films

    Roger Guzman, Jaume Gazquez, Bernat Mundet, Pablo Callado, Laia Soler, Julia Jareño, Mariona Coll, Xavier Obradors, Teresa Puig

  • Probing structural and electronic properties of h-BN by HRTEM and STM

    Ouafi Mouhoub, Christian Ricolleau, Guillaume Wang, Hakim Amara, Amandine Andrieux, Nelly Dorval, Frédéric Fossard, Pierre Lavenus, Jerome Lagoute, Van Dong Pham, Pai Woei Wu, Annick Loiseau, Damien Alloyeau

  • Probing the directionality of local electronic states in SrTiO3 by momentum-selected STEM-EELS

    Atsushi Yamaguchi, Mitsutaka Haruta, Takashi Nemoto, Hiroki Kurata

  • Probing the heterogeneous nucleation interface of TiB2 in Al alloys

    Jiehua Li, Fredrik Hage, Quentin Ramasse, Peter Schumacher

  • Probing the multiscale structure, composition and nanomechanical properties of lipids and biopolymers in natural systems: a few examples.

    Cédric Gaillard

  • Probing the radiative and full electromagnetic local densities of states with electron energy loss spectroscopy and cathodoluminescence spectroscopy

    Arthur Losquin, Mathieu Kociak

  • Progress in analysing lithium ion battery materials in the SEM

    Christian Lang, Andy Naylor, Felix Richter, Christoph Birkl, Stefanie Zekoll, Simon Burgess, Gareth Hughes, David Howey, Peter G. Bruce

  • Properties of low-dimensional electron-beam-sensitive objects by spherical and chromatic aberration-corrected low-voltage high-resolution transmission electron microscopy and spectroscopy

    Ute Kaiser

  • Proposal for an electron orbital angular momentum spectrometer

    Tyler Harvey, Vincenzo Grillo, Benjamin McMorran

  • Prospective scintillators for low-energy BSE detectors

    Ondřej Lalinský, Petr Schauer, Miroslav Kučera, Zuzana Lučeničová, Martin Hanuš

  • Protecting copper TEM specimens against corrosion via e-beam induced carbon deposition

    Felix Seidel, Olivier Richard, Hugo Bender, Wilfried Vandervorst

  • Ptychographic phase reconstruction and aberration correction of STEM image using 4D dataset recorded by pixelated detector

    Ryusuke Sagawa, Hao Yang, Lewys Jones, Martin Simson, Martin Huth, Heike Soltau, Peter Nellist, Yukihito Kondo

  • Pushing the limits of environmental scanning electron microscopy

    Johannes Rattenberger, Harald Fitzek, Hartmuth Schroettner, Julian Wagner, Ferdinand Hofer

Jump to:  View All • a b c d e f g h i j k l m n o [p] q r s t u v w x y z

Most Viewed Abstracts

  • mScarlet, a novel high quantum yield (71%) monomeric red fluorescent protein with enhanced properties for FRET- and super resolution microscopy
  • 3D structure and chemical composition reconstructed simultaneously from HAADF-STEM images and EDS-STEM maps
  • Pixelated STEM detectors: opportunities and challenges
  • Layer specific optical band gap measurement at nanoscale in MoS2 and ReS2 van der Waals compounds by high resolution electron energy loss spectroscopy
  • Atomic relaxation in ultrathin fcc metal nanowires

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