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Performance of the SALVE III corrector for EFTEM applications
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Performances of aberration-corrected monochromatic low-voltage analytical electron microscope
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PH and concentration effect on the optical absorption properties of porphyrin nanorods functionalized graphene oxide.
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Phase contrast transmission electron microscopy with hole-free phase plate for material analysis.
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Phase formation and growth behavior of Co-Ge thin films
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Phase identification of complex grain boundary precipitation in a high Cr and Ni superalloy upon direct-aging
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Phase mapping of 2xxx-series aluminium alloys by scanning precession electron diffraction
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Picometre-precision atomic structure of inversion domain boundaries in GaN
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Piezoelectric thin films investigated by dark-field electron holography and in-situ biasing
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Pixelated STEM detectors: opportunities and challenges
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Plan view STEM analysis of the domain structure in anisotropically strained epitaxial K0.95Na0.05NbO3 ferroelectric films with giant piezoelectricity
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Plasma cleaning effect on the stability of the Epon resin sections
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Plasmonic edge and breathing modes in aluminum nanotriangles
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Plasmonic Resonance in Metallic Nanoparticles
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Platinum shadowing for correlative light and electron microscopy
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Playing around with shape and composition of nanoparticles for various applications
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Point defect driven ferromagnetism in YBa2Cu3O7-x superconductor
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Polar-graded multiferroic SrMnO3 thin films
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Power of FIB-SEM Tomography for Biological Samples
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Pre-Sertoli Cells: A Light And Electron Microscopic Study
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Precession-assisted Quasi-Parallel Illumination STEM on three condenser lenses TEMs
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Precise atomic column position measurements using ISTEM
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Precise STEM measurement of defocus and aberration in monolayer graphene
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Precision and application of atom location in HAADF and ABF
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Precision top-down delayering of microelectronics devices using broad-beam argon ion milling
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Preparation and structural characterization of Au nanoparticles supported on metal oxide nanoplatelets for catalysis by a new two-step method.
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Preparation of high fidelity holographic vortex masks using advanced FIB milling strategies
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Primary particle size distribution measurement of aggregated nanoparticles
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Principle component analysis applied to high resolution cross sectional STEM imaging: Quantitative analysis of 2D heterostructures
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Probing cell behavior: Combining MEMS (microelectromechanical systems) technology with high resolution live cell imaging
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Probing localized strain in solution-derived YBCO nanocomposite films
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Probing structural and electronic properties of h-BN by HRTEM and STM
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Probing the directionality of local electronic states in SrTiO3 by momentum-selected STEM-EELS
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Probing the heterogeneous nucleation interface of TiB2 in Al alloys
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Probing the multiscale structure, composition and nanomechanical properties of lipids and biopolymers in natural systems: a few examples.
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Probing the radiative and full electromagnetic local densities of states with electron energy loss spectroscopy and cathodoluminescence spectroscopy
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Progress in analysing lithium ion battery materials in the SEM
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Properties of low-dimensional electron-beam-sensitive objects by spherical and chromatic aberration-corrected low-voltage high-resolution transmission electron microscopy and spectroscopy
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Proposal for an electron orbital angular momentum spectrometer
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Prospective scintillators for low-energy BSE detectors
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Protecting copper TEM specimens against corrosion via e-beam induced carbon deposition
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Ptychographic phase reconstruction and aberration correction of STEM image using 4D dataset recorded by pixelated detector
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Pushing the limits of environmental scanning electron microscopy
The 16th European Microscopy Congress 2016
August 28 - September 2, 2016 in Lyon, France