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X-ray absorption in pillar shaped TEM specimens
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X-ray emission generation constant from mono-layer graphene measured using STEM-EDS map detected with highly sensitive EDS system.
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XTEM observations revealing high diffusivity and Ge segregation in UV laser pulse annealed SiGeO and GeTiO amorphous films
The 16th European Microscopy Congress 2016
August 28 - September 2, 2016 in Lyon, France