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The 16th European Microscopy Congress 2016

August 28 - September 2, 2016 in Lyon, France

View by Title View Sessions View by Presentation Form
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  • Backscattered-electron SEM contrast of SiO2 nanoparticles

    Thomas Kowoll, Erich Mueller, Dagmar Gerthsen

  • Bandgap measurement of high refractive index materials by EELS

    Maryam Vatanparast, Per Erik Vullum , Johan Verbeeck, Ricardo Egoavil, Turid W. Reenaas, Randi Holmestad

  • Beam exfoliation of MoS2 layers with a helium ion beam

    Hongzhou Zhang, Pierce Maguire, Daniel S Fox, Yangbo Zhou

  • Beating Time and Space resolutions in Ultrasound for disruptive innovations in Medical Imaging

    Mickael Tanter

  • Behaviour of platinum nanoparticles under reducing and oxidising conditions using ESTEM

    Michael Ward, Ed Boyes, Pratibha Gai

  • Benefits of angular and energy separation of slow signal electrons in SEM

    Sarka Mikmekova, Haruo Nakamichi, Masayasu Nagoshi

  • Beyond elemental analysis in the electron microscope: accessing isotopes with in-situ TEM-SIMS correlative analysis.

    Lluis Yedra, Santhana Eswara, David Dowsett, Tom Wirtz

  • Birch pollen – the key to unlock hidden cases of species hybridization

    Kesara Anamthawat-Jonsson, Lilja Karlsdottir

  • Bismuth Ferrite Harmonic Nanoparticles and Biphotonic Microscopy: Innovative Approach to Track In Vivo Muscle Stem Cells, a Promising Candidate for Cell Therapy of Muscular Dystrophy

    Laurence Dubreil, Isabelle leroux, Mireille Ledevin, Claire Lovo, Cindy Schleder, Lydie Lagalice, Sandrine Gerber, Luigi Bonacina, Karl Rouger

  • Bright-field STEM tomography of thick biological sections

    Richard Leapman, Qianping He, Gina Calco, Bryan Kuo, Jake Hoyne, Guofeng Zhang, Maria Aronova

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Most Viewed Abstracts

  • mScarlet, a novel high quantum yield (71%) monomeric red fluorescent protein with enhanced properties for FRET- and super resolution microscopy
  • 3D structure and chemical composition reconstructed simultaneously from HAADF-STEM images and EDS-STEM maps
  • Pixelated STEM detectors: opportunities and challenges
  • Layer specific optical band gap measurement at nanoscale in MoS2 and ReS2 van der Waals compounds by high resolution electron energy loss spectroscopy
  • Atomic relaxation in ultrathin fcc metal nanowires

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