The 16th European Microscopy Congress 2016

August 28 - September 2, 2016 in Lyon, France

View by Title View Sessions View by Presentation Form

Jump to: View All • a [b] c d e f g h i j k l m n o p q r s t u v w x y z

Backscattered-electron SEM contrast of SiO2 nanoparticles

Thomas Kowoll, Erich Mueller, Dagmar Gerthsen
Bandgap measurement of high refractive index materials by EELS

Maryam Vatanparast, Per Erik Vullum , Johan Verbeeck, Ricardo Egoavil, Turid W. Reenaas, Randi Holmestad
Beam exfoliation of MoS2 layers with a helium ion beam

Hongzhou Zhang, Pierce Maguire, Daniel S Fox, Yangbo Zhou
Beating Time and Space resolutions in Ultrasound for disruptive innovations in Medical Imaging

Mickael Tanter
Behaviour of platinum nanoparticles under reducing and oxidising conditions using ESTEM

Michael Ward, Ed Boyes, Pratibha Gai
Benefits of angular and energy separation of slow signal electrons in SEM

Sarka Mikmekova, Haruo Nakamichi, Masayasu Nagoshi
Beyond elemental analysis in the electron microscope: accessing isotopes with in-situ TEM-SIMS correlative analysis.

Lluis Yedra, Santhana Eswara, David Dowsett, Tom Wirtz
Birch pollen – the key to unlock hidden cases of species hybridization

Kesara Anamthawat-Jonsson, Lilja Karlsdottir
Bismuth Ferrite Harmonic Nanoparticles and Biphotonic Microscopy: Innovative Approach to Track In Vivo Muscle Stem Cells, a Promising Candidate for Cell Therapy of Muscular Dystrophy

Laurence Dubreil, Isabelle leroux, Mireille Ledevin, Claire Lovo, Cindy Schleder, Lydie Lagalice, Sandrine Gerber, Luigi Bonacina, Karl Rouger
Bright-field STEM tomography of thick biological sections

Richard Leapman, Qianping He, Gina Calco, Bryan Kuo, Jake Hoyne, Guofeng Zhang, Maria Aronova

Jump to: View All • a [b] c d e f g h i j k l m n o p q r s t u v w x y z