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The 16th European Microscopy Congress 2016

August 28 - September 2, 2016 in Lyon, France

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  • Watching works of art under the synchrotron lights to reveal their secrets

    Marine Cotte

  • Wave front reconstruction vi the transport of intensity equation: Introduction of non-convex constraints

    amin parvizi, Wouter Van den Broek, Katharina Blessing, Christoph T. Koch

  • Wet STEM in SEM for Morphological Characterization of Novel Bacterial Species: Vibrio galatheae and Photobacterium galatheae

    Ramona Valentina Mateiu, Sonia Giubergia, Henrique Machado, Lone Gram, Jakob Birkedal Wagner

  • Where does the FIB sputtered matter accumulate in the SEM chamber ?

    Emmanuel CADEL, Fabien CUVILLY, Charly VAUDOLON, Auriane ETIENNE

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Most Viewed Abstracts

  • mScarlet, a novel high quantum yield (71%) monomeric red fluorescent protein with enhanced properties for FRET- and super resolution microscopy
  • 3D structure and chemical composition reconstructed simultaneously from HAADF-STEM images and EDS-STEM maps
  • Pixelated STEM detectors: opportunities and challenges
  • Layer specific optical band gap measurement at nanoscale in MoS2 and ReS2 van der Waals compounds by high resolution electron energy loss spectroscopy
  • Atomic relaxation in ultrathin fcc metal nanowires

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