EMC Abstracts

Official abstracts site for the European Microscopy Congress

MENU 
  • Home
  • Meetings Archive
    • The 16th European Microscopy Congress 2016
  • Keyword Index
  • Your Favorites
    • Favorites
    • Login
    • Register
    • View and Print All Favorites
    • Clear all your favorites
  • Advanced Search

The 16th European Microscopy Congress 2016

August 28 - September 2, 2016 in Lyon, France

View by Title View Sessions View by Presentation Form
Jump to:  View All • [a] b c d e f g h i j k l m n o p q r s t u v w x y z
  • A closer look at high-resolution electron holography

    Tore Niermann, Michael Lehmann

  • A combined microscopy approach to study plant-phytoplasma interaction using Arabidopsis thaliana.

    Laura Pagliari, Rita Musetti

  • A complex prokaryotic endomembrane system

    Thomas Heimerl, Jennifer Flechsler, Gerhard Wanner, Reinhard Rachel

  • A Compressive Sensing based acquisition design for quantitative ultra-low dose high-resolution imaging and spectroscopy in the STEM

    Dorothea Muecke-Herzberg, Patricia Abellan, Michael Sarahan, Iain Godfrey, Zineb Saghi, Rowan Leary, Andrew Stevens, Jackie Ma, Gitta Kutyniok, Feridoon Azough, Robert Freer, Paul Midgley, Nigel Browning, Quentin Ramasse

  • A Correlative Methodology based on SIMS for Advanced Materials Characterization

    Santhana Eswara, Rong Hu, Lluís Yedra, Jean-Nicolas Audinot, Alexander Schwedt, Cem Tasan, Joachim Mayer, Dierk Raabe, Tom Wirtz

  • A huge but elusive macromolecular cage in enterobacterial stress response as seen by cryoEM and X-ray crystallography

    Eaazhisai Kandiah, Hélène Malet, Diego Carriel, Julien Perard, Maria Bacia, Walid A Houry, Sandrine Ollagnier de Choudens, Sylvie Elsen, Irina Gutsche

  • A JEOL-based cooling holder with a low specimen drift allowing sub 1Å STEM imaging

    David Bell , Henny Zandbergen

  • A magnetic electron energy analyser for use in an SEM

    Christopher Walker, Mohamed El Gomati, Xiaoping Zha

  • A mechanism for the introduction of threading dislocations in III-nitride epitaxial layers from closed basal stacking fault domains

    Julita Smalc-Koziorowska, Calliope Bazioti, Martin Albrecht, Georgios Dimitrakopulos

  • A micro-combinatorial TEM method for phase mapping of thin two-component films

    György Sáfrán

  • A morphological approach for texture detection, application to SEM stereo reconstruction

    Sébastien Drouyer, Serge Beucher, Michel Bilodeau, Maxime Moreaud, Loïc Sorbier

  • A multimodal and multiscale approach to investigate the micronsized organisation of a very complex biological material : the wheat grain.

    Cédric Gaillard

  • A NanoWorkshop Toolkit for in situ Nanoassembly and Nanocharacterization

    Andrew Jonathan Smith, Andreas Rummel, Klaus Schock, Stephan Kleindiek

  • A New Compound Lens Equipped UHR SEM.

    Petr Wandrol, Ernst Jan Vesseur

  • A new high pressure form of Ba3NiSb2O9

    Holger Klein, Céline Darie, Christophe Lepoittevin, Stéphanie Kodjikian, Pierre Bordet, Claire Colin, Oleg Lebedev

  • A new method for quantitative XEDS tomography of complex hetero-nanostructures

    Daniele Zanaga, Thomas Altantzis, Lakshminarayana Polavarapu, Luis M. Liz-Marzán, Bert Freitag, Sara Bals

  • A new method to orient samples by STEM in a scanning electron microscope

    Cheng Sun, Erich Müller, Dagmar Gerthsen

  • A novel way of measuring lifetime at the nanometer scale using specific fast electron-matter interactions

    Sophie Meuret, Luiz Tizei, Thomas Auzelle, Thibault Cazimajou, Romain Bourrellier, Rudee Songmuang, Huan-Cheng Chang, François Treussart, Bruno Daudin, Bruno Gayral, Mathieu Kociak

  • A potential therapeutic effects of BMN673, a novel PARP inhibitor, on Triple Negative Breast Cancer

    Gamze Guney Eskiler, Gulsah Cecener, Unal Egeli, Berrin Tunca

  • A precession electron diffraction study of ordered-disordered phases in Ni-Cr based alloys

    Baptiste Stephan, Damien Jacob, Frederic Delabrouille

  • A protected inert-gas sample manipulation and transfer environment for cryo electron microscopy and analytics

    Georg Alexander Rosenthal, Sebastian Tacke, Falk Lucas, Roger Albert Wepf

  • A Review on Interface Engineering and Thin Film Nanotechnology for Low-Cost High Efficient Photovoltaic (PV) Solar Cell Devices

    Mohamed Saad, J Kim, P Kozlowski, J Ott, D Sadana, T.C Chen

  • A simple shortcut for observing unroofed cells by either TEM or SEM

    Agathe Franck, Jeanne Lainé, Marc Bitoun, Ghislaine Frébourg, Michaël Trichet, Stéphane Vassilopoulos

  • A Study of Heavy Ion Irradiation-Induced Segregation at Grain Boundaries in Alloy 800H

    Joven Jun Hua Lim, M Grace Burke

  • A study of polymorph dynamics in mixed-phase BiFeO3 thin films via AFM and in-situ TEM applications of external stimuli

    Kristina Holsgrove, Martial Duchamp, Niall Browne, David Edwards, Nicolas Bernier, Dipanjan Mazumdar, Marty Gregg, Amit Kumar, Miryam Arredondo

  • A Variable-Temperature Continuous-Flow Liquid-Helium Cryostat Inside a (Scanning) Transmission Electron Microscope

    Felix Börrnert, Alexander Horst, Michael A. Krzyzowski, Bernd Büchner

  • A versatile high-vacuum cryo transfer system for cryo microscopy and analytics

    Sebastian Tacke, Vladislav Krzyzanek, Harald Nüsse, Alexander Rosenthal, Jürgen Klingauf, Roger Albert Wepf, Rudolf Reichelt

  • Aberration Corrected Analytical Scanning and Transmission Electron Microscope for High-Resolution Imaging and Analysis for Multi-User Facilities

    Hiromi Inada, Yoshifumi Taniguchi, Takafumi Yotsuji, Keitaro Watanabe, Hirobumi Muto, Wataru Shimoyama, Hiroaki Matsumoto, Mitsuru Konno

  • Aberration corrected CVD-TEM for in-situ growth of III-V semiconductors

    Reine Wallenberg, Daniel Jacobsson, Kimberly Dick Thelander, Joacim Gustafsson, Stas Dogel

  • Aberration corrected environmental STEM (AC ESTEM) for atom-by-atom analysis of nanoparticle catalyst activation and deactivation mechanisms

    Edward Boyes, Michael Ward, Thomas Martin, Leonardo Lari, Robert Mitchell, Alec LaGrow, David Lloyd, Ian Wright, Pratibha Gai

  • Aberration corrected HRTEM imaging of zeolitic nanocavities

    Kaname Yoshida, Yukichi Sasaki, Hiroki Kurata

  • Aberration-corrected STEM and EELS investigations of grain boundaries in an optimised BaTiO3 based PTCR ceramic

    Kristina Holsgrove, Demie Kepaptsoglou, Alan Douglas, Quentin Ramasse, Eric Prestat, Sarah Haigh, Amit Kumar, Marty Gregg, Miryam Arredondo

  • Absolute quantification of nano-scale precipitates in steel using DualEELS

    Ian MacLaren, Bianca Sala, Joanna Bobynko, Alan J. Craven

  • Absorption-induced enhancement of X-ray contrast by soft X-ray emissions

    Chris Rossouw, David Rossouw, Andreas Korinek, Steffi Woo, Gianluigi Botton

  • Accommodation of oxygen deficiency in La0.5Ca2.5Mn2O7-d and LaSr2Mn2O7-d Ruddlesden-Popper Manganites

    Raquel Cortés-Gil, Daniel Gonzalez-Merchante, Jose M Alonso, Luisa Ruiz-Gonzalez, Jose M Gonzalez-Calbet

  • Accurate and fast electron microscopy simulations using the open source MULTEM program

    Ivan Lobato, Sandra Van Aert, Johan Verbeeck

  • Accurate and precise measurement of cluster sizes in localisation microscopy images using the Rényi divergence

    Adela Staszowska, Patrick Fox-Roberts, Susan Cox

  • ACOM-TEM analysis of the effect of heating on the mineral nanocrystals in bone

    Mariana Verezhak, Edgar F. Rauch, Muriel Veron, Pierre Bordet, Marie Plazanet, Aurélien Gourrier

  • ACOM-TEM and its application for the investigation of deformation pathways in nanocrystalline Pd and AuPd

    Aaron Kobler, Christian Kübel, Horst Hahn

  • Actin-dependent mechanisms during vesicle fusion link exo- and endocytosis in synapses

    Gianvito Arpino, Tuomas Näreoja, Elena Sopova, Oleg Shupliakov

  • Addressing Pseudo-Symmetric Misindexing in EBSD Analysis of gamma -TiAl with High Accuracy Band Detection

    Niels-Henrik Schmidt, Haithem Mansour, Jenny Goulden, Alberto Palomares-García, Rocio Muñoz-Moreno

  • Adiabatic shear loading in thermal spray coatings studied by EBSD

    Dagmar Dietrich, Nuria Cinca, Pawel Sokolowski, Lech Pawlowski, Josep Guilemany, Thomas Lampke

  • Advanced characterization of colloidal semiconductor nanocrystals by 2D and 3D electron microscopy

    Eva Bladt, Bart Goris, Eline Hutter, Ward van der Stam, Relinde Moes, Celso de Mello Donega, Daniël Vanmaekelbergh, Sara Bals

  • Advanced Electron Tomography of Assemblies of Nanoparticles

    Sara Bals, Thomas Altantzis, Daniele Zanaga, Bart Goris, Nathalie Claes, Gustaaf Van Tendeloo

  • Advanced Microstructure Characterization of β Ti-Nb-Ta-Fe Alloys obtained by Powder Metallurgy

    Conrado Ramos Moreira Afonso, A. M. Amigó , V.B. Amigó

  • Advanced STEM characterisation of composition controlled MoxW1 xS2 mixed transition metal dichalcogenide alloys grown by chemical vapour deposition

    Adrian Murdock, Juan G Lozano, Arunvinay Prabakaran, Frank Dillon, Nicole Grobert

  • Advanced TEM of BiCu1-xOS oxysulfide: copper deficiency and electronic properties.

    Oleg Lebedev, David Berthebaud, Emmanuel Guilmeau, Antoine Maignan

  • Advanced TEM study of homogeneous flow and size dependent mechanical behaviour in highly ductile Zr65Ni35 metallic glass films

    Hosni Idrissi, Matteo Ghidelli, Sébastien Gravier, Jean-Jacques Blandin, Jean-Pierre Raskin, Thomas Pardoen, Dominique Schryvers

  • Advances in FIB EDX-Nanotomography

    Marco Cantoni, Farhang Nabiei, Pierre Burdet

  • Advantages and pitfalls for transmission electron microscopic studies in the identification of extracellular vesicles

    Agnes Kittel, Xabier Osteikoetxea, Barbara Sódar, Krisztina Pálóczy, Tamás Baranyai, Zoltán Giricz, Edit Irén Buzás

  • AEM Characterization of the products yielding from Chlorination Process to obtain TiO2 from natural Ilmenite.

    Ludy Caceres Montero, Guillermo Solorzano, Eduardo A. Brocchi

  • Alteration mechanisms of limestone used in built cultural heritage : use of isotoping labelling to determine the water penetration and reaction sitesIn France 52% of the historical monuments are made out of limestone; the preservation of this material is

    Adam Drici, Mandana Saheb, Jean-Didier Mertz, Aurélie Verney-Carron, Loryelle Sessegolo, Laurent Remusat, Adriana Gonzalez-Cano

  • Aluminum nanoflakes: relations between microstructure and reactivity.

    Véronique MADIGOU, Christine LEROUX, Pierre-Henri ESPOSITO, Renaud DENOYEL, Marie-Vanessa COULET

  • AMNIOTIC MEMBRANE SCAFFOLD ENRICHED WITH BLADDER FIBROBLASTS PROMOTES ESTABLISHMENT OF HIGHLY DIFFERENTIATED UROTHELIUM

    Urška Dragin Jerman, Peter Veranič, Tina Cirman, Mateja Erdani Kreft

  • An absolute sample position referencing solution for convenient cross-platform observations; application to the assessment of microscope stability and translation stage reproducibility

    Olivier Acher, Alexander Podzorov, Alexandre Grigoriev

  • An approach towards solving 3D information by combining quantitative ADF STEM and EDX

    Katherine MacArthur, Dogan Ozkaya, Sergio Lozano-Perez, Peter Nellist

  • An artificial neural network based algorithm for three-dimensional quantitative imaging in optical microscopy

    Wouter Van den Broek, Xiaoming Jiang, Christoph T. Koch

  • An in situ multiscale approach for the characterization of plasticity and damage in a TA6V alloy.

    Sophie Cazottes, Sylvain Dancette, Christophe Le Bourlot, Eric Maire , Thomas Paris

  • An in-situ Low Energy Argon Ion Source for Local Surface Modification

    Johannes Mulders, Piet Trompenaars

  • An integrated structural cell biology to unravel the vesicle and membrane coat formation mechanism at the inner nuclear envelope.

    Christoph Hagen, Tzviya Zeev-Ben-Mordehai, Kyle Dent, Michael Grange, Jens B. Bosse, Daven Vasishtan, C. Alistair Siebert, Rainer Kaufmann, Juliana Celeski, Cathy Whittle, Lothar Schermelleh, Barbara Klupp, Gerd Schneider, Wolfram Antonin, Lynn Enquist, Thomas C Mettenleiter, Kay Grünewald

  • An integrated structural perspective on morphogenesis of crustacean epidermis and gut by complementary microscopy

    Polona Mrak, Urban Bogataj, Kristina Žagar, Miran Čeh, Andreja Gajović, Nada Žnidaršič, Jasna Štrus

  • Analysing Jan Steen’s pigments using SEM-EDX quantitative X-ray mapping

    Ralph Haswell, Jesse Wouters, Sabrina Meloni

  • Analysing the tension/compression asymmetry in creep deformed Co-base superalloys using electron microscopy

    Malte Lenz, Yolita Eggeler, Peter Schweizer, Christopher Zenk, Steffen Neumeier, Mathias Göken, Philip Wollgramm, Gunther Eggeler, Erdmann Spiecker

  • Analysis of capping with GaAsSbN thin layers in (un)coupled InAs/GaAs multi quantum dot layers for enhanced solar cells.

    Daniel F. Reyes, Veronica Braza, Antonio D. Utrilla, Teresa Ben, Alvaro Guzman, Adrian Hierro, Jose M. Ulloa, David Gonzalez

  • Analysis of core/shell nanoparticles by electron microscopy techniques

    Natalia Fernández-Delgado, Miriam Herrera-Collado, Pedro Rodríguez-Cantó, Rafael Abargues, E Moya López, Juan Martínez-Pastor, Sergio Molina

  • Analysis of Food Packaging Layered Polymers by SEM/EDS and Raman

    John Konopka, Keith Thompson

  • Analysis of GaAs compound semiconductors and the semiconductor laser diode using electron holography, Lorentz microscopy, electron diffraction microscopy and differential phase contrast STEM.

    Hirokazu Sasaki, Shinya Otomo, Ryuichiro Minato, Kazuo Yamamoto, Tsukasa Hirayama, Jun Yamasaki, Naoya Shibata

  • Analysis of nanoscale band gap fluctuations in Cu(In,Ga)Se2 solar cells by VEELS

    Debora Keller, Stephan Buecheler, Patrick Reinhard, Fabian Pianezzi, Marta D. Rossell, Darius Pohl, Alexander Surrey, Bernd Rellinghaus, Fredrik Hage, Quentin Ramasse, Rolf Erni, Ayodhya N. Tiwari

  • Analysis of semipolar InxGa1-xN/GaN heterostructures by WBDF and HRTEM imaging

    Xiaodan Chen, Haoyuan Qi, Yueliang Li, Tobias Meisch, Ferdinand Scholz, Ute Kaiser

  • Analysis of strain and composition in GeSi/Si heterostructures by electron microscopy

    Knut Müller-Caspary, Andreas Oelsner, Pavel Potapov, Thomas Schmidt

  • Analysis of the binder and carbon black distribution in graphite electrodes for lithium ion batteries using electron dispersive X-Ray spectroscopy and energy selective backscatter electrons

    Lukas Pfaffmann, Marcus Müller, Werner Bauer, Frieder Scheiba, Stefan Jaiser, Michael Baunach, Philip Scharfer, Helmut Ehrenberg

  • Analysis of the Sb and N distribution in GaAsSb/GaAsN superlattices for solar cell applications.

    Daniel F. Reyes, Veronica Braza, Alicia Gonzalo, Antonio D. Utrilla, Davide F. Grossi, Paul M. Koenraad,, Alvaro Guzman, Adrian Hierro, Jose M. Ulloa, Teresa Ben, David Gonzalez

  • Analysis of white-luminescent mesoporous carbonized silica under electron irradiation by TEM-CL system

    Kazuki Oguni, Shunsuke Muto, Yukari Ishikawa, Koji Sato, Yosuke Ishii, Shinji Kawasaki

  • Analysis to reveal dynamical and correlated atomic displacements on gold surfaces depending on various environments

    Ryotaro Aso, Yohei Ogawa, Hideto Yoshida, Seiji Takeda

  • ANALYTICAL ATOMIC-RESOLUTION MICROSCOPY OF OXYGEN DEFICIENT Ca2Mn3O8-d

    ÁNGEL MAZARÍO-FERNÁNDEZ, ALMUDENA TORRES-PARDO, RAQUEL CORTÉS-GIL, AUREA VARELA, MARINA PARRAS, MARIA HERNANDO, JOSE MARÍA GONZÁLEZ-CALBET

  • Analytical electron microscopy and atom probe tomography investigation of interfacial segregation

    F. Danoix, X. Sauvage, M. Gouné, B. Gault , F. Cuvilly

  • Analytical electron microscopy characterization of light-emitting diodes based on ordered InGaN nanocolumns

    Almudena Torres-Pardo, Žarko Gačević, Noemi García-Lepetit, Marcus Müller, Sebastian Metzner, Ana Bengoechea-Encabo, Steven Albert, Frank Bertram, Peter Veit, Juergen Christen, Enrique Calleja, Jose M. González-Calbet

  • Analytical electron microscopy of barium titanate and barium-strontium titanate nanoparticles for second-harmonic biomarkers

    Omar Matar, Nicole Hondow, Olga Posada, Michael Routledge, David Hernandez-Maldonado, Christoph Wälti, Claire Murray, Rik Brydson, Steve Milne, Andy Brown

  • Analytical electron tomographic investigations revealing self stabilization of core-shell precipitates through opposing diffusion processes

    Angelina Orthacker, Georg Haberfehlner, Johannes Taendl, Maria Cecilia Poletti, Bernhard Sonderegger, Gerald Kothleitner

  • Analytical STEM Study of Dy-doped Bi2Te3 Thin Films

    Vesna Srot, Piet Schönherr, Birgit Bussmann, Sara E. Harrison, Peter A. van Aken, Thorsten Hesjedal

  • Analytical STEM study of sintered polycrystalline c-BN materials for cutting tool applications

    Jacob Palmer, Martina Lattemann, Ernesto Coronel, Arno Meingast, Larry Dues, Rachel Shao, Gerold Weinl

  • Angle-resolved cathodoluminescence of plasmonic crystal waveguide

    Hikaru Saito, Naoki Yamamoto, Takumi Sannomiya

  • Angle-resolved cathodoluminescence polarimetry on plasmonic nanostructures

    Toon Coenen, Clara Osorio, Benjamin Brenny, Albert Polman, Femius Koenderink

  • Angle-resolved Scanning Transmission Electron Microscopy (ARSTEM) for materials analysis

    Knut Müller-Caspary, Oliver Oppermann, Tim Grieb, Andreas Rosenauer, Marco Schowalter, Florian F. Krause, Thorsten Mehrtens, Pavel Potapov, Andreas Beyer, Kerstin Volz

  • Anomalous contrast behavior for STEM HAADF imaging of ordered In0.33Ga0.67N monolayers

    Toni Markurt, Tobias Schulz, Xin Qiang Wang, Xian Tong Zheng, Ding Yu Ma, Martin Albrecht

  • Apical chitinous matrix and basal lamina – the ultrastructure and formation of two distinct extracellular matrices of crustacean hindgut cells

    Urban Bogataj, Polona Mrak, Jasna Štrus, Nada Žnidaršič

  • Application of Cryogenic Focused Ion Beam Scanning Electron Microcopy to Hydrogel Characterisation

    Chris Parmenter, Abdulraman Baki, Kevin Shakesheff

  • Application of different imaging techniques for characterization and visualization of micro­ and nanostructural elements in Allvac 718Plus superalloy

    Adam Kruk, Aleksandra Czyrska-Filemonowicz

  • Application of FIB-SEM tomography for analyses of ceramic coatings deposited on titanium alloy and material-cell interface

    Joanna Karbowniczek, Adam Gruszczyński, Adam Kruk, Aleksandra Czyrska-Filemonowicz

  • Application of moiré pseudo atomic column elemental mapping to electron beam-sensitive crystal of mineral

    Yukihito Kondo, Keiichi Fukunaga, Eiji Okunishi, Ichiro Onishi

  • Application of photoconductivity effect in BaTiO3/TiO2 hybrid heterostructure for solar cells

    Milivoj Plodinec, Iva Šrut-Rakić, Andreja Gajović , Ana Šantić, Marc-Georg Willinger

  • Application of statistical beam-rocking TEM-EDX analysis to quantitative occupation site determination of Zn substituted for multiple Fe sites in W-type hexagonal ferrite

    Masahiro Ohtsuka, Shunsuke Muto, Yoshihiro Anan, Yoshinori Kobayashi

  • Applying of Electron Backscatter Diffraction (EBSD) for Studying Structural and Phase Composition of Multilayer CrN/MoN Coatings Fabricated by Arc-PVD

    Bogdan Postolnyi, João Pedro Araújo, Alexander Pogrebnjak

  • Artefact-free top-down TEM lamella preparation from a 14 nm technology IC

    Andrey Denisyuk, Tomáš Hrnčíř, Jozef Vincenc Oboňa, Martin Petrenec, Jan Michalička

  • Assessing chemical and microstructural evolution at interfaces of γ’- strengthened superalloys at high temperature by in situ TEM heating experiments.

    Yolita Eggeler, Daniel Enge, Erdmann Spiecker

  • Assessment of doping profiles in semiconductor nanowires by scanning probe microscopy: Study of p- type doping in ZnO nanowires.

    Georges BREMOND, Lin WANG, Jean-Michel CHAUVEAU, Corine SARTEL, Vincent SALLET

  • Atom probe tomography of early stage clustering in Al alloys

    Stefan Pogatscher, Phillip Dumitraschkewitz, Stephan S.A. Gerstl

  • Atom-counting in a non-probe corrected STEM

    Marco Schowalter, Beeke Gerken, Florian Fritz Krause, Tim Grieb, Knut Müller-Caspary, Christoph Mahr, Thorsten Mehrtens, Mehtap Özaslan, Annick De Backer, Sandra Van Aert, Andreas Rosenauer

  • ATOM-PROBE TOMOGRAPHY AND NANOSCIENCES

    Didier Blavette, Isabelle Mouton, Sébastien Duguay

  • Atom-Resolved STEM Imaging Using a Segmented Detector

    Takehito Seki, Gabriel Sanchez-Santolino, Nathan Lugg, Ryo Ishikawa, Scott D. Findlay, Yuichi Ikuhara, Naoya Shibata

  • Atomic plane resolution EMCD measurement by STEM-EELS under 3-beam diffraction condition

    Jan Rusz, Shunsuke Muto, Jakob Spiegelberg, Roman Adam, Daniel E. Bürgler, Claus M. Schneider

  • Atomic relaxation in ultrathin fcc metal nanowires

    Ahin Roy, Knut Müller, Kenji Kaneko, Andreas Rosenauer, Jörg Weismüller, Abhishek Kumar Singh, N Ravishankar

  • Atomic resolution electron microscopy of cobalt ferrite nanoparticles

    Dominique Piché, Juan G Lozano, Aakash Varambhia, Frank Dillon, Lewys Jones, Peter D Nellist, Nicole Grobert

  • Atomic resolution HAADF STEM tomography using prior physical knowledge and simulated annealing

    Ivan Lobato, Jan De Beenhouwer, Dirk Van Dyck, Sandra Van Aert, Jan Sijbers

  • Atomic resolution HR(S)TEM and EDXS analyses of GaInAs/GaSb and GaInP/GaSb bond interfaces for high-efficiency solar cells

    András Kovács, Martial Duchamp, Felix Predan, Frank Dimroth, Rafal Dunin-Borkowski, Wolfgang Jäger

  • Atomic Resolution STEM and Spectroscopic Characterization of Battery Related Materials

    Yuichi Ikuhara

  • Atomic resolution studies of La0.7Sr0.3MnO3/BaTiO3 multiferroic tunnel junctions

    Mariona Cabero , Ana Perez-Muñoz, David Hernández, Zohuair Sefrioui, Radu Abrudan, Sergio Valencia, Steve John Pennycook, Carlos León, Maria Varela, Jacobo Santamaría

  • Atomic Resolution Tomography of Nanoparticles Reconstructed from Exit Wave

    Fu-Rong Chen

  • Atomic Scale Characterization on III-V Based Heterostructure Nanowire Interfaces

    Sriram Venkatesan, Peter Krogstrup, Christina Scheu, Christian Liebscher, Gerhard Dehm

  • Atomic Scale in-situ Studies of Catalytic Reactions between Iron Clusters and Single-walled Carbon Nanotubes

    Kecheng Cao, Johannes Biskupek, Thomas W. Chamberlain, Andrei N. Khlobystov, Ute Kaiser

  • Atomic scale structure and local chemistry of CoFeB-MgO perpendicular spin injector

    Bingshan TAO, Xavier DEVAUX, Philippe BARATE, Pierre RENUCCI, Bo XU, Julien FROUGIER, Michel HEHN, Stéphane MANGIN, Henri JAFFRES, Jean-Marie GEORGE, Xavier MARIE, Xiufeng HAN, Zhanguo WANG, Yuan LU

  • Atomic scale studies of La/Sr ordering in La2-2xSr1+2xMn2O7 single crystals

    Manuel Roldan , Mark Oxley, Qiang Li, Kenneth Gray, John Mitchell, Stephen Pennycook, Maria Varela

  • Atomic scale study of Cu2O/ZnO heterojunction interfaces by TEM, STEM and DFT

    Sandeep Gorantla, Jiantuo Gan, Ole Martin Løvvik, Spyros Diplas, Kristin Bergum, Bengt Svensson, Edouard Monakhov, Phuong Nguyen, Anette Gunnaes

  • Atomic structure and electronic configurations of 2D thermoelectric cobaltates

    Laura Bocher, Alexandre Gloter, Odile Stéphan, Sylvie Hébert, Denis Pelloquin

  • Atomic structure and magnetic circular dichroism of antiphase boundary defects in NiFe2O4 thin films

    Zechao Wang, Xiaoyan Zhong, Lei Jin, Hideto Yanagihara, Eiji Kita, Hanbo Jiang, Rafal E Dunin-Borkowski

  • Atomic structure and segregation phenomena at copper grain boundaries

    Thorsten Meiners, Christian H. Liebscher, Gerhard Dehm

  • Atomic structure of the ultrathin amorphous aluminium oxide barrier in Al/AlOx/Al Josephson junctions

    Lunjie Zeng, Dung Trung Tran, Cheuk-Wai Tai, Gunnar Svensson, Eva Olsson

  • Atomic structures and dynamic behaviors of domain walls in ferroelectric thin films

    Xiaoqing Pan, Linze Li

  • Atomic structures of interfacial complexions between gold nanoparticles and nominally stable spinel-substrate

    Fang Liu, Dong Yue Xie, Yong-sheng Fu, Guo-zhen Zhu

  • Atomic-level elastic strain measurement of amorphous materials by quantification of local selected area electron diffraction patterns

    Christian Ebner, Rohit Sarkar, Jagannathan Rajagopalan, Christian Rentenberger

  • atomic-resolution analysis of the structure and dopants of beam sensitive ordered porous materials

    Alvaro Mayoral, Jennifer Readman, Marta Navarro, Russell E. Morris, Isabel Díaz

  • Atomic-Scale Compositional Fluctuations in Ternary III-Nitride Nanowires

    Steffi Y Woo, Matthieu Bugnet, Hieu P T Nguyen, Songrui Zhao, Zetian Mi, Gianluigi A Botton

  • Atomic-scale investigation of interface phenomena in two-dimensionally Sr-doped La2CuO4 and La2CuO4/ La2-xSrxNiO4 superlattices

    Yi Wang, Y. Eren Suyolcu, Wilfried Sigle, Ute Salzberger, Federico Baiutti, Giuliano Gregori, Georg Cristiani, Gennady Logvenov, Joachim Maier, Peter van Aken

  • Atomic-scale visualization of the growth and structure of MoS2-based hydrodesulfurization catalysts

    Lars Pilsgaard Hansen, Yuanyuan Zhu, Quentin M. Ramasse, Christian Kisielowski, Christian Dahl-Petersen, Michael Brorson, Stig Helveg

  • Atomically-resolved insight of unusual Sr-Mn(V) oxyhydroxide

    Isabel Gómez-Recio, Almudena Torres-Pardo, María Hernando , Aurea Varela, Marina Parras, Jose Maria Gonzalez-Calbet

  • Atoms in Motion: Electron beam induced dynamics in experiment and simulation

    Daniel Knez, Alexander Volk, Philipp Thaler, Wolfgang Ernst, Ferdinand Hofer

  • Automated in situ transmission electron microscopy experiments

    Martial Duchamp, Vincent Vignères, Gautier Dufourcq, Vadim Migunov, Rafal E. Dunin-Borkowski

  • Automatic FIB-SEM Preparation of Straight Pillars for In-Situ Nanoindentation

    Tobias Volkenandt, Alexandre Laquerre, Michal Postolski, Fabián Pérez-Willard

Jump to:  View All • [a] b c d e f g h i j k l m n o p q r s t u v w x y z

Most Viewed Abstracts

  • mScarlet, a novel high quantum yield (71%) monomeric red fluorescent protein with enhanced properties for FRET- and super resolution microscopy
  • 3D structure and chemical composition reconstructed simultaneously from HAADF-STEM images and EDS-STEM maps
  • Pixelated STEM detectors: opportunities and challenges
  • Layer specific optical band gap measurement at nanoscale in MoS2 and ReS2 van der Waals compounds by high resolution electron energy loss spectroscopy
  • Atomic relaxation in ultrathin fcc metal nanowires

Your Favorites

You can save and print a list of your favorite abstracts by clicking the “Favorite” button at the bottom of any abstract. View your favorites »

Visit Our Partner Sites

The 16th European Microscopy Congress

The official web site of the 16th European Microscopy Congress.

European Microscopy Society

European Microscopy Society logoThe European Microscopy Society (EMS) is committed to promoting the use and the quality of advanced microscopy in all its aspects in Europe.

International Federation of Societies for Microscopy

International Federation of Societies for Microscopy logoThe IFSM aims to contribute to the advancement of microscopy in all its aspects.

Société Française des Microscopies

Société Française des MicroscopiesThe Sfµ is a multidisciplinary society which aims to improve and spread the knowledge about Microscopy.

Connect with us

Imaging & Microscopy
Official Media Partner of the European Microscopy Society.

  • Help & Support
  • About Us
  • Cookies & Privacy
  • Wiley Job Network
  • Terms & Conditions
  • Advertisers & Agents
Copyright © 2021 John Wiley & Sons, Inc. All Rights Reserved.
Wiley
This site uses cookies: Find out more.