The 16th European Microscopy Congress 2016 Archives

Quantative atomic column mapping of oxygen functionalized two-dimensional Ti3C2 MXene sheets

Ingemar Persson, Justinas Palisaitis, Per Persson
Quantification of dopants in nanomaterial by SEM/EDS

Eric Robin, Nicolas Mollard, Kevin Guilloy, Nicolas Pauc, Pascal Gentile, Zhihua Fang, Bruno Daudin, Lynda Amichi, Pierre-Henri Jouneau, Catherine Bougerol, Michael Delalande, Anne-Laure Bavencove
Quantification of particles in samples of a split-virion influenza vaccine

Marie-Claire Nicolai, Aurelie Deliot, Frederic Ronzon, Jean-François Cotte, Catherine Manin, Daniel Nemecek
Quantification of SiO2 nanoparticle sedimentation on A549 cells

Thomas Kowoll, Susanne Fritsch-Decker, Regina Fertig, Erich Mueller, Carsten Weiss, Dagmar Gerthsen
Quantification of the HAADF contrast from the nanometer scale down to the single atomic column: application to quantum cascade lasers

Konstantinos Pantzas, Gilles Patriarche, Ludovic Largeau, Maria Amanti, Angela Vasanelli, Carlo Sirtori, Grégoire Beaudoin, Isabelle Sagnes
Quantifying magnetism on the nanometer scale: EMCD on individual FePt nanoparticles

Sebastian Schneider, Darius Pohl, Stefan Löffler, Deepa Kasinathan, Jan Rusz, Peter Schattschneider, Ludwig Schultz, Bernd Rellinghaus
Quantifying Mg doping in AlGaN layers

Lynda Amichi, Isabelle Mouton, Eric Robin, Vincent Delaye, Nicolas Mollard, Philippe Vennéguès, Samuel Matta, Julien Brault, Adeline Grenier, Pierre-Henri Jouneau, Catherine Bougerol
Quantifying the hole distribution in cuprates: Atomic-resolution near-edge fine-structures of the superconductor Sr3Ca11Cu24O41

Matthieu Bugnet, Guillaume Radtke, Stefan Löffler, Peter Schattschneider, David Hawthorn, Hanna A. Dabkowska, Graeme M. Luke, George A. Sawatzky, Gianluigi A. Botton
Quantifying transition radiation by employing CL and EELS

Michael Stöger-Pollach
Quantitative 3D analysis of huge nanoparticles assemblies

Daniele Zanaga, Folkert Bleichrodt, Thomas Altantzis, Naomi Winckelmansa, Willem Jan Palenstijn, Jan Sijbers, Bart de Nijs, Marijn A. van Huis, Luis M. Liz-Marzán, Alfons van Blaaderen, K. Joost Batenburg, Gustaaf Van Tendeloo, Sara Bals
Quantitative analysis of a model pharmaceutical material, theophylline, by transmission electron microscopy

James Cattle, Mark S'ari, Patricia Abellán, Quentin Ramasse, Nicole Hondow, Andy Brown, Rik Brydson
Quantitative analysis of AlN/SiC interfaces in AlGaN/GaN heterostructures grown on SiC

Alexandra Gkanatsiou, Christos B. Lioutas, Nikolaos Frangis
Quantitative and non-destructive defect metrology for beyond Si semiconductors

Anna Prokhodtseva, Tomas Vystavel, Andreas Schulze, Matty Caymax
Quantitative annular dark-field imaging at atomic resolution

Shunsuke Yamashita, Shogo Koshiya, Kazuo Ishizuka, Koji Kimoto
Quantitative approach to twin boundaries in Cu3Pt nanoparticles

Goran Drazic, Francisco Ruiz Zepeda, Anja Lautar, Primoz Jovanovic, Marjan Bele, Miran Gaberscek
Quantitative coherent Raman scattering microscopies: new tools for the material and life sciences

Andreas Volkmer
Quantitative comparison of phase contrast imaging in conventional TEM focal series and STEM ptychography

Emanuela Liberti, Hao Yang, Gerardo Martinez, Peter Nellist, Angus Kirkland
Quantitative compositional characterisation of fuel-cell catalysts using EDX ionisation cross sections.

Katherine MacArthur, Thomas Slater, Sarah Haigh, Dogan Ozkaya, Marc Heggen, Peter Nellist, Sergio Lozano-Perez
Quantitative compositional mapping on the nanoscale over large fields of view in thin film solar cells from earth abundant elements

Thomas Thersleff, Sergio Giraldo, Haibing Xie, Paul Pistor, Edgardo Saucedo, Klaus Leifer
Quantitative electron diffraction tomography for the structure solution of cathode materials for Li-ion batteries

Olesia Karakulina, Stanislav Fedotov, Vasiliy Sumanov, Oleg Drozhzhin, Nellie Khasanova, Evgeny Antipov, Artem Abakumov, Joke Hadermann
Quantitative Electron Tomography Study of Metal Catalysts Supported on Heavy Oxides Combining Image De-noising and Compressed Sensing Techniques

Miguel Lopez-Haro, Miguel Tinoco, Ana Belen Hungria , Jose Juan Calvino
Quantitative elemental and bonding EELS tomography of a complex nanoparticle

Francisco de la Peña, Tomas Ostaševičius, Rowan K. Leary, Caterina Ducati, Paul A. Midgley, Raúl Arenal
Quantitative energy dispersive X-ray spectroscopy on thin SiGe layers

Markus Andreas Schubert, Peter Zaumseil, Ioan Costina, Holger Rücker
Quantitative evaluation of the (211)B GaAs/InAs quantum dot heterostructure

Thomas Kehagias, Nikoletta Florini, Joseph Kioseoglou, George Dimitrakopulos, Savvas Germanis, Charalambos Katsidis, Zacharias Hatzopoulos, Nikolaos Pelekanos
Quantitative image analysis of binary microstructures: Application to the characterisation of dairy systems

David Legland, Juliana V.C. Silva, Chantal Cauty, Kolotueva Irina, Julianne Floury
Quantitative investigation of the all round shape memory effect in a Ni51Ti49 alloy by TEM orientation imaging

Xiayang Yao, Yuanyuan Li, Shanshan Cao, Xiao Ma, Xin-ping Zhang, Dominique Schryvers
Quantitative low-voltage spherical and chromatic aberration-corrected high-resolution TEM analysis of beam-specimen interactions in single-layer MoS2 and MoS2/graphene heterostructures

Tibor Lehnert, Johannes Biskupek, Janis Köster, Martin Linck, Ute Kaiser
Quantitative measurement of doping and surface charge in a ZnO nanowire using in-situ biasing and off-axis electron holography

Martien den Hertog, Fabrice Donatini, Robert McLeod, Eva Monroy, Julien Pernot
Quantitative measurement of mean inner potential and specimen thickness from high-resolution off-axis electron holograms of ultra-thin layered WSe2

Florian Winkler, Amir H. Tavabi, Juri Barthel, Martial Duchamp, Emrah Yucelen, Sven Borghardt, Beata E. Kardynal, Rafal E. Dunin-Borkowski
Quantitative measurement of the charge distribution along a tungsten nanotip using transmission electron holography

Fengshan Zheng, Vadim Migunov, Urs Ramsperger, Danilo Pescia, Rafal E.Dunin-Borkowski
Quantitative measurements of nanoscale electrostatic and mean inner potentials in crystals by electron beam refraction using CBED and DPC

Mingjian Wu, Erdmann Spiecker
Quantitative Nanoplasmonics in the TEM

Michel Bosman
Quantitative observation of low energy electron channeling contrast from sub-nanometer thick surface layers using hexagonal Silicon Carbide single crystal

Koji Ashida, Yasunori Kutsuma, Tadaaki Kaneko
Quantitative phase imaging with using orientation-independent differential interference contrast (OI-DIC) microscopy

Shribak Michael
Quantitative Stage Mapping of a Zircon grain by WDS on an SEM

Steve Seddio, Keith Thompson
Quantitative STEM – From composition to atomic electric fields

Andreas Rosenauer, Knut Müller-Caspary, Marco Schowalter, Tim Grieb, Florian F. Krause, Thorsten Mehrtens, Armand Béché, Johan Verbeeck, Josef Zweck, Stefan Löffler, Peter Schattschneider, Marcus Müller, Peter Veit, Sebastian Metzner, Frank Bertram, Jürgen Christen, Tillmann Schimpke, Martin Strassburg, Rafal E. Dunin-Borkowski, Florian Winkler, Martial Duchamp
Quantitative STEM analysis of multiscale CNT assemblies

Karthikeyan Gnanasekaran, Gijsbertus de With, Heiner Friedrich
Quantitative STEM Atom Counting in Supported Metal Nanoparticles

Judith Yang, Stephen House, Yuxiang Chen, Dong Su, Tom Schamp, Russell Henry, Eric Stach, Rongchao Jin
Quantitative use of EELS Mo-M2,3 edges for the study of molybdenum oxides: elemental quantification and determination of Mo valence state

Luc Lajaunie, Florent Boucher, Rémi Dessapt, Philippe Moreau
Quasi in-situ catalytic studies using a TEM grid microreactor

Liudmyla Masliuk, Marc G. Willinger, Darren Dunphy, Robert Schlögl, Thomas Lunkenbein
Quasi-Nanofluidic liquid cell for in situ liquid Trasmission Electron Microscopy

Simone Lagana, Esben Kirk Mikkelsen, Hongyu Sun, Rodolphe Marie, Kristian Mølhave