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The 16th European Microscopy Congress 2016

August 28 - September 2, 2016 in Lyon, France

View by Title View Sessions View by Presentation Form
Jump to:  View All • a b c d e f g h i j k l m n o p [q] r s t u v w x y z
  • Quantative atomic column mapping of oxygen functionalized two-dimensional Ti3C2 MXene sheets

    Ingemar Persson, Justinas Palisaitis, Per Persson

  • Quantification of dopants in nanomaterial by SEM/EDS

    Eric Robin, Nicolas Mollard, Kevin Guilloy, Nicolas Pauc, Pascal Gentile, Zhihua Fang, Bruno Daudin, Lynda Amichi, Pierre-Henri Jouneau, Catherine Bougerol, Michael Delalande, Anne-Laure Bavencove

  • Quantification of particles in samples of a split-virion influenza vaccine

    Marie-Claire Nicolai, Aurelie Deliot, Frederic Ronzon, Jean-François Cotte, Catherine Manin, Daniel Nemecek

  • Quantification of SiO2 nanoparticle sedimentation on A549 cells

    Thomas Kowoll, Susanne Fritsch-Decker, Regina Fertig, Erich Mueller, Carsten Weiss, Dagmar Gerthsen

  • Quantification of the HAADF contrast from the nanometer scale down to the single atomic column: application to quantum cascade lasers

    Konstantinos Pantzas, Gilles Patriarche, Ludovic Largeau, Maria Amanti, Angela Vasanelli, Carlo Sirtori, Grégoire Beaudoin, Isabelle Sagnes

  • Quantifying magnetism on the nanometer scale: EMCD on individual FePt nanoparticles

    Sebastian Schneider, Darius Pohl, Stefan Löffler, Deepa Kasinathan, Jan Rusz, Peter Schattschneider, Ludwig Schultz, Bernd Rellinghaus

  • Quantifying Mg doping in AlGaN layers

    Lynda Amichi, Isabelle Mouton, Eric Robin, Vincent Delaye, Nicolas Mollard, Philippe Vennéguès, Samuel Matta, Julien Brault, Adeline Grenier, Pierre-Henri Jouneau, Catherine Bougerol

  • Quantifying the hole distribution in cuprates: Atomic-resolution near-edge fine-structures of the superconductor Sr3Ca11Cu24O41

    Matthieu Bugnet, Guillaume Radtke, Stefan Löffler, Peter Schattschneider, David Hawthorn, Hanna A. Dabkowska, Graeme M. Luke, George A. Sawatzky, Gianluigi A. Botton

  • Quantifying transition radiation by employing CL and EELS

    Michael Stöger-Pollach

  • Quantitative 3D analysis of huge nanoparticles assemblies

    Daniele Zanaga, Folkert Bleichrodt, Thomas Altantzis, Naomi Winckelmansa, Willem Jan Palenstijn, Jan Sijbers, Bart de Nijs, Marijn A. van Huis, Luis M. Liz-Marzán, Alfons van Blaaderen, K. Joost Batenburg, Gustaaf Van Tendeloo, Sara Bals

  • Quantitative analysis of a model pharmaceutical material, theophylline, by transmission electron microscopy

    James Cattle, Mark S'ari, Patricia Abellán, Quentin Ramasse, Nicole Hondow, Andy Brown, Rik Brydson

  • Quantitative analysis of AlN/SiC interfaces in AlGaN/GaN heterostructures grown on SiC

    Alexandra Gkanatsiou, Christos B. Lioutas, Nikolaos Frangis

  • Quantitative and non-destructive defect metrology for beyond Si semiconductors

    Anna Prokhodtseva, Tomas Vystavel, Andreas Schulze, Matty Caymax

  • Quantitative annular dark-field imaging at atomic resolution

    Shunsuke Yamashita, Shogo Koshiya, Kazuo Ishizuka, Koji Kimoto

  • Quantitative approach to twin boundaries in Cu3Pt nanoparticles

    Goran Drazic, Francisco Ruiz Zepeda, Anja Lautar, Primoz Jovanovic, Marjan Bele, Miran Gaberscek

  • Quantitative coherent Raman scattering microscopies: new tools for the material and life sciences

    Andreas Volkmer

  • Quantitative comparison of phase contrast imaging in conventional TEM focal series and STEM ptychography

    Emanuela Liberti, Hao Yang, Gerardo Martinez, Peter Nellist, Angus Kirkland

  • Quantitative compositional characterisation of fuel-cell catalysts using EDX ionisation cross sections.

    Katherine MacArthur, Thomas Slater, Sarah Haigh, Dogan Ozkaya, Marc Heggen, Peter Nellist, Sergio Lozano-Perez

  • Quantitative compositional mapping on the nanoscale over large fields of view in thin film solar cells from earth abundant elements

    Thomas Thersleff, Sergio Giraldo, Haibing Xie, Paul Pistor, Edgardo Saucedo, Klaus Leifer

  • Quantitative electron diffraction tomography for the structure solution of cathode materials for Li-ion batteries

    Olesia Karakulina, Stanislav Fedotov, Vasiliy Sumanov, Oleg Drozhzhin, Nellie Khasanova, Evgeny Antipov, Artem Abakumov, Joke Hadermann

  • Quantitative Electron Tomography Study of Metal Catalysts Supported on Heavy Oxides Combining Image De-noising and Compressed Sensing Techniques

    Miguel Lopez-Haro, Miguel Tinoco, Ana Belen Hungria , Jose Juan Calvino

  • Quantitative elemental and bonding EELS tomography of a complex nanoparticle

    Francisco de la Peña, Tomas Ostaševičius, Rowan K. Leary, Caterina Ducati, Paul A. Midgley, Raúl Arenal

  • Quantitative energy dispersive X-ray spectroscopy on thin SiGe layers

    Markus Andreas Schubert, Peter Zaumseil, Ioan Costina, Holger Rücker

  • Quantitative evaluation of the (211)B GaAs/InAs quantum dot heterostructure

    Thomas Kehagias, Nikoletta Florini, Joseph Kioseoglou, George Dimitrakopulos, Savvas Germanis, Charalambos Katsidis, Zacharias Hatzopoulos, Nikolaos Pelekanos

  • Quantitative image analysis of binary microstructures: Application to the characterisation of dairy systems

    David Legland, Juliana V.C. Silva, Chantal Cauty, Kolotueva Irina, Julianne Floury

  • Quantitative investigation of the all round shape memory effect in a Ni51Ti49 alloy by TEM orientation imaging

    Xiayang Yao, Yuanyuan Li, Shanshan Cao, Xiao Ma, Xin-ping Zhang, Dominique Schryvers

  • Quantitative low-voltage spherical and chromatic aberration-corrected high-resolution TEM analysis of beam-specimen interactions in single-layer MoS2 and MoS2/graphene heterostructures

    Tibor Lehnert, Johannes Biskupek, Janis Köster, Martin Linck, Ute Kaiser

  • Quantitative measurement of doping and surface charge in a ZnO nanowire using in-situ biasing and off-axis electron holography

    Martien den Hertog, Fabrice Donatini, Robert McLeod, Eva Monroy, Julien Pernot

  • Quantitative measurement of mean inner potential and specimen thickness from high-resolution off-axis electron holograms of ultra-thin layered WSe2

    Florian Winkler, Amir H. Tavabi, Juri Barthel, Martial Duchamp, Emrah Yucelen, Sven Borghardt, Beata E. Kardynal, Rafal E. Dunin-Borkowski

  • Quantitative measurement of the charge distribution along a tungsten nanotip using transmission electron holography

    Fengshan Zheng, Vadim Migunov, Urs Ramsperger, Danilo Pescia, Rafal E.Dunin-Borkowski

  • Quantitative measurements of nanoscale electrostatic and mean inner potentials in crystals by electron beam refraction using CBED and DPC

    Mingjian Wu, Erdmann Spiecker

  • Quantitative Nanoplasmonics in the TEM

    Michel Bosman

  • Quantitative observation of low energy electron channeling contrast from sub-nanometer thick surface layers using hexagonal Silicon Carbide single crystal

    Koji Ashida, Yasunori Kutsuma, Tadaaki Kaneko

  • Quantitative phase imaging with using orientation-independent differential interference contrast (OI-DIC) microscopy

    Shribak Michael

  • Quantitative Stage Mapping of a Zircon grain by WDS on an SEM

    Steve Seddio, Keith Thompson

  • Quantitative STEM – From composition to atomic electric fields

    Andreas Rosenauer, Knut Müller-Caspary, Marco Schowalter, Tim Grieb, Florian F. Krause, Thorsten Mehrtens, Armand Béché, Johan Verbeeck, Josef Zweck, Stefan Löffler, Peter Schattschneider, Marcus Müller, Peter Veit, Sebastian Metzner, Frank Bertram, Jürgen Christen, Tillmann Schimpke, Martin Strassburg, Rafal E. Dunin-Borkowski, Florian Winkler, Martial Duchamp

  • Quantitative STEM analysis of multiscale CNT assemblies

    Karthikeyan Gnanasekaran, Gijsbertus de With, Heiner Friedrich

  • Quantitative STEM Atom Counting in Supported Metal Nanoparticles

    Judith Yang, Stephen House, Yuxiang Chen, Dong Su, Tom Schamp, Russell Henry, Eric Stach, Rongchao Jin

  • Quantitative use of EELS Mo-M2,3 edges for the study of molybdenum oxides: elemental quantification and determination of Mo valence state

    Luc Lajaunie, Florent Boucher, Rémi Dessapt, Philippe Moreau

  • Quasi in-situ catalytic studies using a TEM grid microreactor

    Liudmyla Masliuk, Marc G. Willinger, Darren Dunphy, Robert Schlögl, Thomas Lunkenbein

  • Quasi-Nanofluidic liquid cell for in situ liquid Trasmission Electron Microscopy

    Simone Lagana, Esben Kirk Mikkelsen, Hongyu Sun, Rodolphe Marie, Kristian Mølhave

Jump to:  View All • a b c d e f g h i j k l m n o p [q] r s t u v w x y z

Most Viewed Abstracts

  • mScarlet, a novel high quantum yield (71%) monomeric red fluorescent protein with enhanced properties for FRET- and super resolution microscopy
  • 3D structure and chemical composition reconstructed simultaneously from HAADF-STEM images and EDS-STEM maps
  • Pixelated STEM detectors: opportunities and challenges
  • Layer specific optical band gap measurement at nanoscale in MoS2 and ReS2 van der Waals compounds by high resolution electron energy loss spectroscopy
  • Atomic relaxation in ultrathin fcc metal nanowires

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