Quantitative Nanoplasmonics in the TEM
1 Institute of Materials Research and Engineering, A*STAR (Agency for Science, Technology and Research), 2 Fusionopolis Way, #08-03 Innovis, Singapore 138634. firstname.lastname@example.org
Scanning TEM (STEM)-based surface plasmon characterization will be discussed in this paper, and it will be argued that some plasmon properties can be measured quantitatively in the STEM, by carefully analyzing the local spectral response. Examples will be given that demonstrate the unique capability of STEM-based plasmon analysis in comparison with other experimental techniques.
Some very impressive experimental results have recently been published in which plasmons on subwavelength metal nanostructures were mapped with 1-100 fs time resolution. These include time-domain techniques based on photoelectron emission microscopy (PEEM) [1, 2], time-resolved scanning near-field optical microscopy (SNOM) , ultrafast TEM  and even plasmon mapping with free electron lasers .
STEM-based electron energy-loss spectroscopy (EELS) is performed in the energy/frequency domain, and it has a long history as an experimental technique for surface plasmon characterization [6-17]. However, since surface plasmon resonances are damped harmonic oscillators, it is possible to interpret the EELS plasmon spectra as Fourier-transforms of oscillations in the time-domain .
This paper will explore the implications of this approach, and will apply it to quantify local dynamic materials properties .
The National Research Foundation (NRF) is kindly acknowledged for supporting this research under the CRP program (award No. NRF-CRP 8-2011-07). This work results from close collaborations with the groups of Joel Yang (SUTD, Singapore), Christian Nijhuis (NUS, Singapore), Erik Dujardin (CE-MES, France). Antonio Fernández-Domínguez (UAM, Spain), Wu Lin & Bai Ping (IHPC, Singapore).
 MI Stockman et al. Nature Photon. 1, 539-544 (2007).
 E Mårsell et al. Nano Lett. 15, 6601-6608 (2015).
 Y. Nishiyama et al. J. Phys. Chem. C 119, 16215-16222 (2015).
 A Yurtsever et al. Science 335, 59–64 (2012).
 SE Irvine et al., Phys. Rev. Lett. 93 (18) 184801 (2004).
 C Powell and JB Swan, Phys. Rev. 115, 869–875 (1959).
 PE Batson, Phys. Rev. Lett. 49, 936–940 (1982).
 ZL Wang, JM Cowley, Ultramicrosopy 21, 347–366 (1987).
 F Ouyang, PE Batson and M Isaacson, Phys. Rev. B 46, 15421–15425 (1992).
 J Nelayah et al., Nature Phys. 3, 348 – 353 (2007).
 M Bosman et al., Nanotechnology 18, 165505 (2007).
 B Schaffer et al., Phys. Rev. B 041401 (2009).
 B. Ögüt et al. ACS Nano 5 (8) 6701-6706 (2011).
 H Duan et al. Nano Lett. 12, 1683–1689 (2012).
 M Bosman et al. ACS Nano 6 (1) 319-326 (2012).
 D Rossouw and GA Botton, Phys. Rev. Lett. 110, 066801 (2013).
 S Raza et al., Optics Express 21 (22) 27344 (2013).
 A Teulle et al. Nature Materials 14, 87-94 (2015).
 M Bosman et al. Scientific Reports 3 1312 (2013).
 M Bosman et al. Scientific Reports 4 5537 (2014).
To cite this abstract:Michel Bosman; Quantitative Nanoplasmonics in the TEM. The 16th European Microscopy Congress, Lyon, France. https://emc-proceedings.com/abstract/quantitative-nanoplasmonics-in-the-tem/. Accessed: October 31, 2020
EMC Abstracts - https://emc-proceedings.com/abstract/quantitative-nanoplasmonics-in-the-tem/