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The 16th European Microscopy Congress 2016 » Instrumentation and Methods » Phase Microscopies

Meeting: The 16th European Microscopy Congress 2016

Session: Instrumentation and Methods

Topic: Phase Microscopies

  • A closer look at high-resolution electron holography

    Tore Niermann, Michael Lehmann

  • Analysis of GaAs compound semiconductors and the semiconductor laser diode using electron holography, Lorentz microscopy, electron diffraction microscopy and differential phase contrast STEM.

    Hirokazu Sasaki, Shinya Otomo, Ryuichiro Minato, Kazuo Yamamoto, Tsukasa Hirayama, Jun Yamasaki, Naoya Shibata

  • Calculation of phase contrast in Cc/Cs-corrected STEM

    Zhongbo Lee, Ute Kaiser, Harald Rose

  • Can quantum wave filters outperform image processing?

    Laura Clark, Jo Verbeeck

  • Charge transfer sensitivity and dose efficiency with pixilated detectors and ptychographic phase contrast imaging in STEM

    Timothy Pennycook, Hao Yang, Clemens Mangler, Stefen Hummel, Bernhard Bayer, Jani Kotakoski, Peter Nellist, Jannik Meyer

  • Concepts for an electrostatic phase shifting device

    Tolga Wagner, Tore Niermann, Dirk Berger, Michael Lehmann

  • Developing new electron interferometry configurations in I2TEM thanks to electron optics simulations

    Yudai Kubo, Christophe Gatel, Yoshifumi Taniguchi, Etienne Snoeck, Florent Houdellier

  • Diffraction holography for the phase retrieval of vortex beams

    Federico Venturi, Vincenzo Grillo, Ebrahim Karimi, Roberto Balboni, Gian Carlo Gazzadi, Marco Campanini, Stefano Frabboni, Robert W Boyd

  • Direct comparison of differential phase contrast and off-axis electron holography for the measurement of electric potentials by the examination of reverse biased Si p-n junctions and III-V samples

    Benedikt Haas, David Cooper, Jean-Luc Rouvière

  • Direct comparison of differential phase contrast and off-axis electron holography for the measurement of electric potentials by the examination of reverse biased Si p-n junctions and III-V samples.

    Benedikt Haas, David Cooper, Jean-Luc Rouviere

  • Direct determination of calibration factors for quantitative DPC measurements

    Felix Schwarzhuber, Johannes Wild, Josef Zweck

  • Direct Visualization of Magnetic Skyrmion by Aberration-Corrected Differential Phase Contrast Scanning Transmission Electron Microscopy

    Takao Matsumoto, Yeong-Gi So, Yuji Kohno, Hidetaka Sawada, Yuichi Ikuhara, Naoya Shibata

  • Double crystal interference experiments

    Amir H. Tavabi, Martial Duchamp, Rafal E. Dunin-Borkowski, Giulio Pozzi

  • DPC measurements on annealed cobalt thin films

    Thomas Beer , Felix Schwarzhuber, Josef Zweck

  • Effects of dose and image registration on exit wave reconstruction of low-dose focal series

    Chen Huang, Hidetaka Sawada, Angus Kirkland

  • Efficient generation of electron Bessel beams using generic magnetic vortex structures

    Changlin Zheng, Timothy C Petersen, Holm Kirmse, Wolfgang Neumann, Joanne Etheridge

  • Electron holography by means of tilted reference waves

    Falk Röder, Axel Lubk, Florent Houdellier, Thibaud Denneulin, Etienne Snoeck, Martin Hÿtch

  • Electron interferometry techniques for strain analysis using a multi-biprism microscope

    Thibaud Denneulin, Falk Röder, Florent Houdellier, Christophe Gatel, Etienne Snoeck, Martin Hÿtch

  • Exotic Electron topologies – Knitting with electron vortices

    Laura Clark, Jo Verbeeck

  • Fabrication and characterization of a fine electron biprism on a Si-on-insulator MEMS chip

    Martial Duchamp, Olivier Girard, Florian Winkler, Rolf Speen, Rafal E. Dunin-Borkowski

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