The 16th European Microscopy Congress 2016 » Instrumentation and Methods » Phase Microscopies

Meeting: The 16th European Microscopy Congress 2016

Session: Instrumentation and Methods

Topic: Phase Microscopies

A closer look at high-resolution electron holography

Tore Niermann, Michael Lehmann
Analysis of GaAs compound semiconductors and the semiconductor laser diode using electron holography, Lorentz microscopy, electron diffraction microscopy and differential phase contrast STEM.

Hirokazu Sasaki, Shinya Otomo, Ryuichiro Minato, Kazuo Yamamoto, Tsukasa Hirayama, Jun Yamasaki, Naoya Shibata
Calculation of phase contrast in Cc/Cs-corrected STEM

Zhongbo Lee, Ute Kaiser, Harald Rose
Can quantum wave filters outperform image processing?

Laura Clark, Jo Verbeeck
Charge transfer sensitivity and dose efficiency with pixilated detectors and ptychographic phase contrast imaging in STEM

Timothy Pennycook, Hao Yang, Clemens Mangler, Stefen Hummel, Bernhard Bayer, Jani Kotakoski, Peter Nellist, Jannik Meyer
Concepts for an electrostatic phase shifting device

Tolga Wagner, Tore Niermann, Dirk Berger, Michael Lehmann
Developing new electron interferometry configurations in I2TEM thanks to electron optics simulations

Yudai Kubo, Christophe Gatel, Yoshifumi Taniguchi, Etienne Snoeck, Florent Houdellier
Diffraction holography for the phase retrieval of vortex beams

Federico Venturi, Vincenzo Grillo, Ebrahim Karimi, Roberto Balboni, Gian Carlo Gazzadi, Marco Campanini, Stefano Frabboni, Robert W Boyd
Direct comparison of differential phase contrast and off-axis electron holography for the measurement of electric potentials by the examination of reverse biased Si p-n junctions and III-V samples

Benedikt Haas, David Cooper, Jean-Luc Rouvière
Direct comparison of differential phase contrast and off-axis electron holography for the measurement of electric potentials by the examination of reverse biased Si p-n junctions and III-V samples.

Benedikt Haas, David Cooper, Jean-Luc Rouviere
Direct determination of calibration factors for quantitative DPC measurements

Felix Schwarzhuber, Johannes Wild, Josef Zweck
Direct Visualization of Magnetic Skyrmion by Aberration-Corrected Differential Phase Contrast Scanning Transmission Electron Microscopy

Takao Matsumoto, Yeong-Gi So, Yuji Kohno, Hidetaka Sawada, Yuichi Ikuhara, Naoya Shibata
Double crystal interference experiments

Amir H. Tavabi, Martial Duchamp, Rafal E. Dunin-Borkowski, Giulio Pozzi
DPC measurements on annealed cobalt thin films

Thomas Beer , Felix Schwarzhuber, Josef Zweck
Effects of dose and image registration on exit wave reconstruction of low-dose focal series

Chen Huang, Hidetaka Sawada, Angus Kirkland
Efficient generation of electron Bessel beams using generic magnetic vortex structures

Changlin Zheng, Timothy C Petersen, Holm Kirmse, Wolfgang Neumann, Joanne Etheridge
Electron holography by means of tilted reference waves

Falk Röder, Axel Lubk, Florent Houdellier, Thibaud Denneulin, Etienne Snoeck, Martin Hÿtch
Electron interferometry techniques for strain analysis using a multi-biprism microscope

Thibaud Denneulin, Falk Röder, Florent Houdellier, Christophe Gatel, Etienne Snoeck, Martin Hÿtch
Exotic Electron topologies – Knitting with electron vortices

Laura Clark, Jo Verbeeck
Fabrication and characterization of a fine electron biprism on a Si-on-insulator MEMS chip

Martial Duchamp, Olivier Girard, Florian Winkler, Rolf Speen, Rafal E. Dunin-Borkowski

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