The 16th European Microscopy Congress 2016 » Instrumentation and Methods » Micro-Nano Lab and dynamic microscopy

Meeting: The 16th European Microscopy Congress 2016

Session: Instrumentation and Methods

Topic: Micro-Nano Lab and dynamic microscopy

10 bar nanoreactors for in situ transmission electron microscopy

Gregory Pandraud, Bruno Morana, Jia Wei, Casper Juffermans
A NanoWorkshop Toolkit for in situ Nanoassembly and Nanocharacterization

Andrew Jonathan Smith, Andreas Rummel, Klaus Schock, Stephan Kleindiek
A simple shortcut for observing unroofed cells by either TEM or SEM

Agathe Franck, Jeanne Lainé, Marc Bitoun, Ghislaine Frébourg, Michaël Trichet, Stéphane Vassilopoulos
Aberration corrected CVD-TEM for in-situ growth of III-V semiconductors

Reine Wallenberg, Daniel Jacobsson, Kimberly Dick Thelander, Joacim Gustafsson, Stas Dogel
Aberration corrected environmental STEM (AC ESTEM) for atom-by-atom analysis of nanoparticle catalyst activation and deactivation mechanisms

Edward Boyes, Michael Ward, Thomas Martin, Leonardo Lari, Robert Mitchell, Alec LaGrow, David Lloyd, Ian Wright, Pratibha Gai
An in situ multiscale approach for the characterization of plasticity and damage in a TA6V alloy.

Sophie Cazottes, Sylvain Dancette, Christophe Le Bourlot, Eric Maire , Thomas Paris
Analysis to reveal dynamical and correlated atomic displacements on gold surfaces depending on various environments

Ryotaro Aso, Yohei Ogawa, Hideto Yoshida, Seiji Takeda
Atoms in Motion: Electron beam induced dynamics in experiment and simulation

Daniel Knez, Alexander Volk, Philipp Thaler, Wolfgang Ernst, Ferdinand Hofer
Automatic FIB-SEM Preparation of Straight Pillars for In-Situ Nanoindentation

Tobias Volkenandt, Alexandre Laquerre, Michal Postolski, Fabián Pérez-Willard
Cathodoluminescence for in situ plasmonic sensing of beam effects.

Carl Wadell, Satoshi Inagaki, Hiroki Ohnishi, Takumi Sannomiya
CelDi: Development of an advanced solid / fluid reaction stage for SEM

Johan Salacroup, Gautier Gonnet, Antoine Candeias, Henri-Pierre Brau, Stéphanie Szenknect, Paul Ivaldi, Renaud Podor
CO adsorption on Au(110) and Pd70Au30(110) : an in situ comparative study by environmental STM

Marie-Angélique Languille, Eric Ehret, Francisco José Cadete Santos Aires
Cobalt-cerium coating formation: from ESEM to TEM analyses

Stéphane Poitel, Jun Zhu, Cécile Hébert, Jan Van Herle, Marc Willinger
Correlating structure and mechanical properties for submicron amorphous silica spheres

Stefan Romeis, Patrick Herre, Mirza Mačković, Jochen Schmidt, Jonas Paul, Dominique de Ligny, Erdmann Spiecker, Wolfgang Peukert
Depth Dependence of the Spatial Resolution in Scanning Transmission Electron Microscopy Experiments

Andreas Verch, Niels de Jonge
Development of a novel straining holder for TEM compatible with electron tomography

Kazuhisa Sato, Hiroya Miyazaki, Takashi Gondo, Shinsuke Miyazaki, Mitsuhiro Murayama, Satoshi Hata
Development of an in-situ specimen holder for high-voltage environmental electron microscopy of fuel cells

Takafumi Ishida, Takayoshi Tanji, Masahiro Tomita, Kimitaka Higuchi, Koh Saitoh
Dynamic oxidation and reduction of catalytic nickel nanoparticles using E(S)TEM.

David Lloyd, Alec LaGrow, Edward Boyes, Pratibha Gai
Dynamical Holographic Moirés : Time average holographic interferometry

Christophe Gatel, Aurélien Masseboeuf, Florent Houdellier, Etienne Snoeck
Dynamics of magnetic domain walls and skyrmions studied by high resolution XMCD-PEEM microscopy

Stefania Pizzini, Jan Vogel, Nicolas Rougemaille, Fausto Sirotti, Julio Cesar, Dayane Chaves, Onur Mentes, Michael Foester, Lucia Aballe, Andrea Locatelli, Olivier Boulle

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