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The 16th European Microscopy Congress 2016 » Instrumentation and Methods » Micro-Nano Lab and dynamic microscopy

Meeting: The 16th European Microscopy Congress 2016

Session: Instrumentation and Methods

Topic: Micro-Nano Lab and dynamic microscopy

  • 10 bar nanoreactors for in situ transmission electron microscopy

    Gregory Pandraud, Bruno Morana, Jia Wei, Casper Juffermans

  • A NanoWorkshop Toolkit for in situ Nanoassembly and Nanocharacterization

    Andrew Jonathan Smith, Andreas Rummel, Klaus Schock, Stephan Kleindiek

  • A simple shortcut for observing unroofed cells by either TEM or SEM

    Agathe Franck, Jeanne Lainé, Marc Bitoun, Ghislaine Frébourg, Michaël Trichet, Stéphane Vassilopoulos

  • Aberration corrected CVD-TEM for in-situ growth of III-V semiconductors

    Reine Wallenberg, Daniel Jacobsson, Kimberly Dick Thelander, Joacim Gustafsson, Stas Dogel

  • Aberration corrected environmental STEM (AC ESTEM) for atom-by-atom analysis of nanoparticle catalyst activation and deactivation mechanisms

    Edward Boyes, Michael Ward, Thomas Martin, Leonardo Lari, Robert Mitchell, Alec LaGrow, David Lloyd, Ian Wright, Pratibha Gai

  • An in situ multiscale approach for the characterization of plasticity and damage in a TA6V alloy.

    Sophie Cazottes, Sylvain Dancette, Christophe Le Bourlot, Eric Maire , Thomas Paris

  • Analysis to reveal dynamical and correlated atomic displacements on gold surfaces depending on various environments

    Ryotaro Aso, Yohei Ogawa, Hideto Yoshida, Seiji Takeda

  • Atoms in Motion: Electron beam induced dynamics in experiment and simulation

    Daniel Knez, Alexander Volk, Philipp Thaler, Wolfgang Ernst, Ferdinand Hofer

  • Automatic FIB-SEM Preparation of Straight Pillars for In-Situ Nanoindentation

    Tobias Volkenandt, Alexandre Laquerre, Michal Postolski, Fabián Pérez-Willard

  • Cathodoluminescence for in situ plasmonic sensing of beam effects.

    Carl Wadell, Satoshi Inagaki, Hiroki Ohnishi, Takumi Sannomiya

  • CelDi: Development of an advanced solid / fluid reaction stage for SEM

    Johan Salacroup, Gautier Gonnet, Antoine Candeias, Henri-Pierre Brau, Stéphanie Szenknect, Paul Ivaldi, Renaud Podor

  • CO adsorption on Au(110) and Pd70Au30(110) : an in situ comparative study by environmental STM

    Marie-Angélique Languille, Eric Ehret, Francisco José Cadete Santos Aires

  • Cobalt-cerium coating formation: from ESEM to TEM analyses

    Stéphane Poitel, Jun Zhu, Cécile Hébert, Jan Van Herle, Marc Willinger

  • Correlating structure and mechanical properties for submicron amorphous silica spheres

    Stefan Romeis, Patrick Herre, Mirza Mačković, Jochen Schmidt, Jonas Paul, Dominique de Ligny, Erdmann Spiecker, Wolfgang Peukert

  • Depth Dependence of the Spatial Resolution in Scanning Transmission Electron Microscopy Experiments

    Andreas Verch, Niels de Jonge

  • Development of a novel straining holder for TEM compatible with electron tomography

    Kazuhisa Sato, Hiroya Miyazaki, Takashi Gondo, Shinsuke Miyazaki, Mitsuhiro Murayama, Satoshi Hata

  • Development of an in-situ specimen holder for high-voltage environmental electron microscopy of fuel cells

    Takafumi Ishida, Takayoshi Tanji, Masahiro Tomita, Kimitaka Higuchi, Koh Saitoh

  • Dynamic oxidation and reduction of catalytic nickel nanoparticles using E(S)TEM.

    David Lloyd, Alec LaGrow, Edward Boyes, Pratibha Gai

  • Dynamical Holographic Moirés : Time average holographic interferometry

    Christophe Gatel, Aurélien Masseboeuf, Florent Houdellier, Etienne Snoeck

  • Dynamics of magnetic domain walls and skyrmions studied by high resolution XMCD-PEEM microscopy

    Stefania Pizzini, Jan Vogel, Nicolas Rougemaille, Fausto Sirotti, Julio Cesar, Dayane Chaves, Onur Mentes, Michael Foester, Lucia Aballe, Andrea Locatelli, Olivier Boulle

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