The 16th European Microscopy Congress 2016
STEM investigation of titania supported gold nanoparticles stabilized by ceria
Gold nanoparticles show an excellent catalytic performance in energy production related processes such as low temperature CO oxidation, PROX and WGS reactions [1-2]. The effect…The 16th European Microscopy Congress 2016
Nanoscale quantitative characterization of 22nm CMOS transistor using Scanning Transmission Electron Microscopy (STEM)
22nm Silicon-On-Insulator (SOI) complementary metal-oxide semiconductor (CMOS) technology has a number of performance boosters, such as third generation embedded DRAM, embedded stressor technology and…The 16th European Microscopy Congress 2016
Recent applications of high energy and spatial resolution STEM-EELS to energy harvesting materials
A new generation of electron beam monochromators has recently pushed the energy resolution of (scanning) transmission electron microscopes deep into the sub 20meV range [1].…The 16th European Microscopy Congress 2016
Optics at the nanoscale with fast electron spectroscopies
1. Laboratoire de Physique des Solides, CNRS, Orsay, France
Electron microscopy techniques have been used to probe the optical properties of materials in the subwavelength scale. In particular, it has been shown that using…The 16th European Microscopy Congress 2016
Multi-modal electron tomography for 3D spectroscopic analysis using limited projections
Electron tomography applied to spectroscopic signals in the scanning transmission electron microscope (STEM) offers the possibility for quantitative determination of structure-chemistry relationships with nanometre…The 16th European Microscopy Congress 2016
Helios G4: Combination of ultrathin damage-free TEM sample preparation and high-resolution STEM imaging in a single instrument
Development in semiconductor industry as well as in materials research has lead to a further decrease in observed features sizes. STEM in SEM imaging has…The 16th European Microscopy Congress 2016
Correlation of interface morphology and composition in GaInP/GaAs with growth conditions
Ternary (GaIn)P materials ststems grown on GaAs have attracted a lot of attention for laser applications, especially due to the low recombination velocities at the…The 16th European Microscopy Congress 2016
X-ray emission generation constant from mono-layer graphene measured using STEM-EDS map detected with highly sensitive EDS system.
1. EM Business Unit, JEOL, Ltd., 3-1-2, Musashino, Akishima, Tokyo, Japon
X-ray generation constant of an atom by an electron irradiated is essential information for quantification of sample in X-ray fluorescence spectroscopy. The generated X-ray intensity…The 16th European Microscopy Congress 2016
Analytical STEM study of sintered polycrystalline c-BN materials for cutting tool applications
Cubic boron nitride (c-BN) is the second hardest material next to diamond with high thermal conductivity but better chemical stability than diamond, therefore, it is…The 16th European Microscopy Congress 2016
Defect Investigation by Atomic-Resolution STEM of III-V Horizontal Nanowires grown via Template-Assisted Selective area Epitaxy
Scaling of silicon microelectronics is reaching fundamental physical limitations related in particular to the power consumption. A possible solution is represented by III-V semiconductors integrated…
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