Scaling of silicon microelectronics is reaching fundamental physical limitations related in particular to the power consumption. A possible solution is represented by III-V semiconductors integrated on Si which have much higher electron mobility and injection velocity. The possibility to grow III-V nan-owires allows also the creation of new transistor concepts for Tunnel Field-Effect Transistors , which could lead to an increase in the efficiency of the circuits by reducing the supply voltage and thus the power consumption.
The growth of III-V nanowires by Template Assisted Selective Epitaxy (TASE) (Fig. 1a)  has enabled the direct integration of heterostructures on Si (100) for TFET applications. The performance of the de-vice may however be affected by the presence of defects (twins, dislocations, stacking faults, anti-phase boundaries) along the nanowire since every single discontinuity in the crystal can lead to a mod-ification in the electrical properties of the material. The understanding, control and suppression of such defects have always been a very challenging task and a crucial point to obtain well performing devices.
Here, we report the investigation of different III-V compounds, by means of atomic-resolution STEM, starting from GaAs homostructures to InAs-GaSb heterostructures (Fig.1b), allowing detailed charac-terization of defects, strains and compositions. We make use of the large degree of freedom of growth parameters in the TASE technique (temperature, V/III ratio, molar flux of precursors) to prepare nan-owire samples (Fig.1b) with the aim to find the right parameters combination to reduce the defects density. Our analysis confirms a process-dependent defect density in nanowires and shows that de-fect-free nanowires can be indeed obtained by optimizing the growth conditions (Fig.2).
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Acknowledgments: This work was supported by the Swiss National Science Foundation (project no. 200021_156746) and E2SWITCH (project no. 619509).
To cite this abstract:Nicolas Bologna, Moritz Knoedler, Mattias Borg, Davide Cutaia, Rolf Erni, Heike Riel, Marta Rossel D.; Defect Investigation by Atomic-Resolution STEM of III-V Horizontal Nanowires grown via Template-Assisted Selective area Epitaxy. The 16th European Microscopy Congress, Lyon, France. https://emc-proceedings.com/abstract/defect-investigation-by-atomic-resolution-stem-of-iii-v-horizontal-nanowires-grown-via-template-assisted-selective-area-epitaxy/. Accessed: July 13, 2020
EMC Abstracts - https://emc-proceedings.com/abstract/defect-investigation-by-atomic-resolution-stem-of-iii-v-horizontal-nanowires-grown-via-template-assisted-selective-area-epitaxy/