Articles tagged "STEM"

• The 16th European Microscopy Congress 2016

  STEM investigation of titania supported gold nanoparticles stabilized by ceria

  Ana Hungría (1), Miguel Tinoco (1), Eloy Del Río (1), Ramón Manzorro (1), Miguel A. Cauqui (1), Jose Juan Calvino (1), José A. Perez-Omil (1)

  1. Dpto. Ciencia de Materiales e I.M. y Química Inorgánica, Universidad de Cádiz, Puerto Real, Espagne

  Gold nanoparticles show an excellent catalytic performance in energy production related processes such as low temperature CO oxidation, PROX and WGS reactions [1-2]. The effect…

• The 16th European Microscopy Congress 2016

  Nanoscale quantitative characterization of 22nm CMOS transistor using Scanning Transmission Electron Microscopy (STEM)

  Weihao Weng (1), Claude Ortolland (2)

  1. Center for Complex Analysis, GlobalFoundries Inc., Hopewell Junction, NY, Etats-Unis 2. Advanced Technology Development, GlobalFoundries Inc., Hopewell Junction, NY, Etats-Unis

      22nm Silicon-On-Insulator (SOI) complementary metal-oxide semiconductor (CMOS) technology has a number of performance boosters, such as third generation embedded DRAM, embedded stressor technology and…

• The 16th European Microscopy Congress 2016

  Recent applications of high energy and spatial resolution STEM-EELS to energy harvesting materials

  Quentin Ramasse (1), Alpesh Shukla (1), Fredrik Hage (1), Demie Kepaptsoglou (1), Feridoon Azough (2), Robert Freer (2)

  1. SuperSTEM Laboratory, SciTech Daresbury Campus, Daresbury, Royaume Uni 2. Department of Materials, University of Manchester, Manchester, Royaume Uni

  A new generation of electron beam monochromators has recently pushed the energy resolution of (scanning) transmission electron microscopes deep into the sub 20meV range [1].…

• The 16th European Microscopy Congress 2016

  Optics at the nanoscale with fast electron spectroscopies

  Luiz Tizei (1)

  1. Laboratoire de Physique des Solides, CNRS, Orsay, France

  Electron microscopy techniques have been used to probe the optical properties of materials in the subwavelength scale. In particular, it has been shown that using…

• The 16th European Microscopy Congress 2016

  Multi-modal electron tomography for 3D spectroscopic analysis using limited projections

  Sean Collins (1), Joshua Einsle (1, 2), Zineb Saghi (1, 3), Robert Blukis (2), Richard Harrison (2), Paul Midgley (1)

  1. Department of Materials Science and Metallurgy, University of Cambridge, 27 Charles Babbage Road, Cambridge, CB3 0FS, Royaume Uni 2. Department of Earth Sciences, University of Cambridge, Cambridge, Royaume Uni 3. Present address: CEA, LETI, MINATEC Campus, F-38054 Grenoble, France

       Electron tomography applied to spectroscopic signals in the scanning transmission electron microscope (STEM) offers the possibility for quantitative determination of structure-chemistry relationships with nanometre…

• The 16th European Microscopy Congress 2016

  Helios G4: Combination of ultrathin damage-free TEM sample preparation and high-resolution STEM imaging in a single instrument

  Jan Skalicky (1), Tomas Vystavel (1), Lubomir Tuma (1), Richard Young (2)

  1. Research & Development, FEI Company, Vlastimila Pecha 1282/12, 627 00 Brno, République tchèque 2. Research & Development, FEI Company, 5350 NE Dawson Creek Drive, Hillsboro, OR 97124, Etats-Unis

  Development in semiconductor industry as well as in materials research has lead to a further decrease in observed features sizes. STEM in SEM imaging has…

• The 16th European Microscopy Congress 2016

  Correlation of interface morphology and composition in GaInP/GaAs with growth conditions

  Han Han (1), Andreas Beyer (1), Jürgen Belz (1), Alexander König (2), Wolfgang Stolz (1), Kerstin Volz (1)

  1. Faculty of Physics and Materials Science Center, Philipps-Universität Marburg, Marburg, Allemagne 2. Zentrum für Tumor und Immunbiologie, Philipps-Universität Marburg, Marburg, Allemagne

  Ternary (GaIn)P materials ststems grown on GaAs have attracted a lot of attention for laser applications, especially due to the low recombination velocities at the…

• The 16th European Microscopy Congress 2016

  X-ray emission generation constant from mono-layer graphene measured using STEM-EDS map detected with highly sensitive EDS system.

  Yu Jimbo (1), Takeo Sasaki (1), Hidetaka Sawada (1), Eiji Okunishi (1), Yukihito Kondo (1)

  1. EM Business Unit, JEOL, Ltd., 3-1-2, Musashino, Akishima, Tokyo, Japon

  X-ray generation constant of an atom by an electron irradiated is essential information for quantification of sample in X-ray fluorescence spectroscopy. The generated X-ray intensity…

• The 16th European Microscopy Congress 2016

  Analytical STEM study of sintered polycrystalline c-BN materials for cutting tool applications

  Jacob Palmer (1), Martina Lattemann (2), Ernesto Coronel (2), Arno Meingast (2), Larry Dues (1), Rachel Shao (1), Gerold Weinl (3)

  1. Technology, Sandvik Hyperion, Worthington, Etats-Unis 2. Materials Characterization, Sandvik Coromant, Stockholm, Suède 3. Materials Design and Sintering, Sandvik Coromant, Stockholm, Suède

  Cubic boron nitride (c-BN) is the second hardest material next to diamond with high thermal conductivity but better chemical stability than diamond, therefore, it is…

• The 16th European Microscopy Congress 2016

  Defect Investigation by Atomic-Resolution STEM of III-V Horizontal Nanowires grown via Template-Assisted Selective area Epitaxy

  Nicolas Bologna (1, 2, 3), Moritz Knoedler (2, 3), Mattias Borg (4, 2), Davide Cutaia (2), Rolf Erni (1), Heike Riel (2), Marta Rossel D. (1, 2)

  1. Electron Microscopy Center, Empa, Dubendorf, Suisse 2. M.I.N.D., IBM ZRL, Ruschlikon, Suisse 3. Laboratoire des Matériaux Semiconducteurs, EPFL, Lausanne, Suisse 4. Electrical and Information Technology, Lund University, Lund, Suède

  Scaling of silicon microelectronics is reaching fundamental physical limitations related in particular to the power consumption. A possible solution is represented by III-V semiconductors integrated…