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The 16th European Microscopy Congress 2016 » Poster

Meeting: The 16th European Microscopy Congress 2016

Presentation Form: Poster

  • ‘Slice & View’ nano-tomography of porous media using FIB-SEM

    Yang Liu, Pierre Le Fur, Marijn van Huis, Oliver Plümper

  • (S)TEM Study of the Influence of Synthesis conditions on the Nanostructure and Performance of Au/CeO2 Model Catalysts

    Miguel Tinoco, Susana Fernandez-Garcia, Miguel Lopez-Haro, Ana Belen Hungria, Xiaowei Chen, Ginesa Blanco, Jose Antonio Perez-Omil, Sebastian Collins, Hanako Okuno, José Juan Calvino

  • 10 bar nanoreactors for in situ transmission electron microscopy

    Gregory Pandraud, Bruno Morana, Jia Wei, Casper Juffermans

  • 2D-TEM investigations of CNTs synthetized within vertical-PAA templates for devices applications

    Ileana Florea, Leandro Nicolas Sacco , Marc Chatelet, Costel-Sorin Cojocaru

  • 3 dimensional measurements of tuberculosis granulomas using optical clearing techniques

    Robert Francis, James Keeble, Bhagwati Khatri, Belinda Dagg, Mei Mei Ho, Kirsty MacLellan-Gibson

  • 3-D areal functional parameters extracted from AFM data of polished dental tooth-restorative nanocomposites

    Tijana Lainović, Ştefan Ţălu , Sebastian Stach , Marko Vilotić, Larisa Blažić

  • 3-D reconstruction of surface topography in SEM by means of energy filtered SE and BSE

    Stepan Kupreenko, Eduard Rau, Andrey Tatarintsev, Sergey Zaytsev

  • 3D characterization using transmission electron diffraction, neural network optimization, and density functional theory

    Robert S. Pennington, Christoph T. Koch

  • 3D elemental analysis of the rod-shape alloy by using EDS tomography

    Yoshitaka Aoyama, Hideo Nishioka, Yukihito Kondo

  • 3D Elemental and interdependent reconstructions based on a novel compressed sensing algorithm in electron tomography

    Tony Printemps, Nicolas Bernier, Eric Robin, Zineb Saghi, Lionel Hervé

  • 3D Elemental Mapping of Non-metallic Inclusions in Japanese Sword with FIB-SEM / EDS System

    Hideki MATSUSHIMA, Masahiro KITADA, Minoru SUZUKI, Toshiyuki KANAZAWA

  • 3D Fourier transform analysis and Diffractogram analysis to evaluate a high-performance TEM

    Kazuo Ishizuka, Koji Kimoto

  • 3D investigation of a PS/ABS polymer using different microscopy techniques

    X. Jaurand , E. Errazuriz , S. Reynaud , Th. Douillard , F. Dalmas , S. Descartes , F. Simonet , M. Mondon , I. Anselme-Bertrand

  • 3D Investigation of InGaN Nanodisks in GaN Nanowires

    Katharina I. Gries, Julian Schlechtweg, Andreas Beyer, Pascal Hille, Jörg Schörmann, Martin Eickhoff, Kerstin Volz

  • 3D Mapping of electric potentials and magnetic fields at the nanoscale using Electron Holographic Tomography

    Daniel Wolf, Axel Lubk, Hannes Lichte

  • 3D Reconstruction of Crack Formation in Austempered Ductile Cast Iron after an In-situ Tensile Test

    Hana Tesařová, Jiří Dluhoš, Martin Petrenec, Jaroslav Polák, Karel Krahula

  • 3D reconstruction of Euglena gracilis using serial block face scanning electron microscopy

    Jana Nebesarova, Eva Dobakova , Michal Petrov, Tomas Bily, Marie Vancova

  • 3D structure and chemical composition reconstructed simultaneously from HAADF-STEM images and EDS-STEM maps

    Zhichao Zhong, Bart Goris, Remco Schoenmakers, Sara Bals, K. Joost Batenburg

  • 3D structure and growth of inversion domain boundaries in nanowires of InRO3(ZnO)m (R = Al, Fe, Ga, In) – an electron microscopy study

    Gunnar Schaan, Herbert Schmid, Werner Mader

  • 3D study of pore space morphology of the shales

    Alexey Mikhutkin, Evgeniy Pichkur, Igor Karateev, Mikhail Spasennykh, Alexander Vasiliev

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« View all presentation forms from the The 16th European Microscopy Congress 2016

Most Viewed Abstracts

  • mScarlet, a novel high quantum yield (71%) monomeric red fluorescent protein with enhanced properties for FRET- and super resolution microscopy
  • 3D structure and chemical composition reconstructed simultaneously from HAADF-STEM images and EDS-STEM maps
  • Pixelated STEM detectors: opportunities and challenges
  • Layer specific optical band gap measurement at nanoscale in MoS2 and ReS2 van der Waals compounds by high resolution electron energy loss spectroscopy
  • Atomic relaxation in ultrathin fcc metal nanowires

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