EMC Abstracts

Official abstracts site for the European Microscopy Congress

MENU 
  • Home
  • Meetings Archive
    • The 16th European Microscopy Congress 2016
  • Keyword Index
  • Your Favorites
    • Favorites
    • Login
    • Register
    • View and Print All Favorites
    • Clear all your favorites
  • Advanced Search

Quantitative phase imaging with using orientation-independent differential interference contrast (OI-DIC) microscopy

Abstract number:

Session Code:

Meeting: The 16th European Microscopy Congress 2016

Session: Instrumentation and Methods

Topic: Phase Microscopies

Presentation Form: Oral Presentation

Corresponding Email:

Shribak Michael (1)

1. Marine Biological Laboratory, Woods Hole, Etats-Unis

Keywords: Differential interference contrast, interference microscopy, quantitative phase microscopy

Conventional differential interference contrast (DIC) microscope shows the two-dimensional distribution of optical phase gradient encountered along the shear direction between two interfering beams. Therefore, contrast of DIC images varies proportionally to cosine of the angle made by azimuth of the phase gradient and the direction of wavefront shear. The image contrast also depends on the initial phase difference (bias) between the interfering beams. To overcome the limitations of DIC systems, we have developed a quantitative orientation-independent differential interference contrast (OI-DIC) microscope, which allows the bias to be modulated and shear directions to be switched rapidly without mechanically rotating the specimen or the prisms [1]. A set of raw DIC images with orthogonal shear directions and different biases is captured within a second. Specialized software computes the phase gradient vector map and then the quantitative phase image.

The new OI-DIC beam-shearing assembly is shown in Fig.1. It consists of two standard DIC prisms with a liquid crystal 90º polarization rotator in between. The shear plane of the first prism DIC1 is oriented at 0º, and the shear plane of the second prism DIC2 is oriented at 90º. Another liquid crystal cell works as a phase shifter, which modulates the bias. Its principal plane is oriented at 0º. We employed a twisted-nematic liquid crystal cell as 90º rotator and an untwisted nematic cell as phase shifter. The OI-DIC technique can use any high-NA objective lens at the full aperture and provides an optical path length (OPL) or phase map with the highest resolution. Unlike other phase mapping techniques, the OI-DIC does not require phase unwrapping and calibration. The OI-DIC can also be combined with other imaging modalities such as fluorescence and polarization.

An example of the computed OPL gradient map is shown in Fig. 2. The image displays a 4-µm thick glass rod that is embedded in immersion liquid with refractive index 1.47. The image brightness is linearly proportional to OPL gradient magnitude. White level corresponds to gradient magnitude 200 nm/nm. The hue depicts the gradient direction, as it is illustrated by the color wheel in the left bottom corner. We used microscope Olympus BX61 equipped with objective lens UPlanSApo 100x/1.40 Oil.

The obtained OPL gradient map was processed by Fourier integration to compute the OPL (phase) map, which is represented in Fig. 3. The image brightness is linearly proportional to OPL and phase. White corresponds to 500nm (OPL) and 5.75rad (phase) at wavelength λ=546 nm.

Fig.4 displays cross-sections of the OPL and phase maps of 4-µm thick glass rods in immersion liquids with the refractive indices 1.47 (red curve), 1.51 (orange curve), 1.54 (blue curve), 1.56 (violet curve), and 1.58 (green curve). Refractive index of the glass is 1.56. An extremum OPL is determined by formula:

OPL=(nr -nim)d,

where nr  and nim are refractive indices of rod and immersion, respectively, d is diameter of the rod. As one can see, the OPL maxima and minimum are practically equal to the theoretical values 360nm, 200nm, 80nm, 0nm, and -80nm.

The OI-DIC assemblies fit into existing slots of a regular research grade microscope. We confirmed that a microscope upgraded with the OI-DIC provides lateral resolution ~200 nm and axial resolution ~100 nm at wavelength 546 nm. The OPL noise level was ~0.5nm. According our best knowledge, the images with such high level of resolution cannot be produced by any other currently available interference and phase microscopy techniques.

Acknowledgements

This publication was made possible by Grant Number R01-GM101701 from the National Institute of General Medical Sciences, National Institutes of Health (USA). Its contents are solely the responsibility of the author and do not necessarily represent the official views of the National Institute of General Medical Sciences or the National Institutes of Health.

References:


Figures:

Fig. 1. Optical scheme of OI-DIC beam-shearing assembly with phase shifter.

Fig. 2. Optical path length gradient map of a 4-µm thick glass rod embedded in immersion liquid with refractive index 1.47. Image size is 19µm x23µm.

Fig. 3. Computed grayscale optical path length (phase) map of 4-µm thick glass rod embedded in immersion liquid with refractive index 1.47.

Fig. 4. Cross-sections of the optical path length (phase) map of 4-µm thick glass rods in immersion liquids with the different refractive indices.

To cite this abstract:

Shribak Michael; Quantitative phase imaging with using orientation-independent differential interference contrast (OI-DIC) microscopy. The 16th European Microscopy Congress, Lyon, France. https://emc-proceedings.com/abstract/quantitative-phase-imaging-with-using-orientation-independent-differential-interference-contrast-oi-dic-microscopy/. Accessed: December 4, 2023
Save to PDF

« Back to The 16th European Microscopy Congress 2016

EMC Abstracts - https://emc-proceedings.com/abstract/quantitative-phase-imaging-with-using-orientation-independent-differential-interference-contrast-oi-dic-microscopy/

Most Viewed Abstracts

  • mScarlet, a novel high quantum yield (71%) monomeric red fluorescent protein with enhanced properties for FRET- and super resolution microscopy
  • 3D structure and chemical composition reconstructed simultaneously from HAADF-STEM images and EDS-STEM maps
  • Layer specific optical band gap measurement at nanoscale in MoS2 and ReS2 van der Waals compounds by high resolution electron energy loss spectroscopy
  • Pixelated STEM detectors: opportunities and challenges
  • Developments in unconventional dark field TEM for characterising nanocatalyst systems

Your Favorites

You can save and print a list of your favorite abstracts by clicking the “Favorite” button at the bottom of any abstract. View your favorites »

Visit Our Partner Sites

The 16th European Microscopy Congress

The official web site of the 16th European Microscopy Congress.

European Microscopy Society

European Microscopy Society logoThe European Microscopy Society (EMS) is committed to promoting the use and the quality of advanced microscopy in all its aspects in Europe.

International Federation of Societies for Microscopy

International Federation of Societies for Microscopy logoThe IFSM aims to contribute to the advancement of microscopy in all its aspects.

Société Française des Microscopies

Société Française des MicroscopiesThe Sfµ is a multidisciplinary society which aims to improve and spread the knowledge about Microscopy.

Imaging & Microscopy
Official Media Partner of the European Microscopy Society.

  • Help & Support
  • About Us
  • Cookie Preferences
  • Cookies & Privacy
  • Wiley Job Network
  • Terms & Conditions
  • Advertisers & Agents
Copyright © 2023 John Wiley & Sons, Inc. All Rights Reserved.
Wiley