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Articles tagged "XEDS"

  • The 16th European Microscopy Congress 2016

    A new method for quantitative XEDS tomography of complex hetero-nanostructures

    Daniele Zanaga (1), Thomas Altantzis (1), Lakshminarayana Polavarapu (2), Luis M. Liz-Marzán (3), Bert Freitag (4), Sara Bals (1)

    1. EMAT, University of Antwerp, Antwerpen, Belgique 2. Photonics and Optoelectronics Group, Ludwig Maximilian University of Munich, Munich, Allemagne 3. BioNanoPlasmonics Laboratory, CIC biomaGUNE, San Sebastián, Espagne 4. Building AAE, FEI Company, Eindhoven, Pays-Bas

    Over the last decades, electron tomography based on HAADF-STEM has evolved into a standard technique to investigate the morphology and inner structure of nanomaterials. The…
  • The 16th European Microscopy Congress 2016

    SIev: Implementation of an anisotropic binning strategy to optimize the chemical analysis of heterogeneous interfaces

    Carlos F. Afonso (1), Enrique Carbó-Argibay (2), Marcel S. Claro (3), Daniel G. Stroppa (2)

    1. Department of Informatics, University of Minho, Braga, Portugal 2. QEM, INL, Braga, Portugal 3. Institute of Physics, University of São Paulo, São Paulo, Portugal

    Outstanding properties emerge at the interfaces of heterogeneous materials, so that their engineering offers promising prospects for achieving novel functional structures. The design and realization…

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