The 16th European Microscopy Congress 2016
A new method for quantitative XEDS tomography of complex hetero-nanostructures
Over the last decades, electron tomography based on HAADF-STEM has evolved into a standard technique to investigate the morphology and inner structure of nanomaterials. The…The 16th European Microscopy Congress 2016
SIev: Implementation of an anisotropic binning strategy to optimize the chemical analysis of heterogeneous interfaces
Outstanding properties emerge at the interfaces of heterogeneous materials, so that their engineering offers promising prospects for achieving novel functional structures. The design and realization…
Official abstracts site for the European Microscopy Congress