The 16th European Microscopy Congress 2016
X-ray emission generation constant from mono-layer graphene measured using STEM-EDS map detected with highly sensitive EDS system.
1. EM Business Unit, JEOL, Ltd., 3-1-2, Musashino, Akishima, Tokyo, Japon
X-ray generation constant of an atom by an electron irradiated is essential information for quantification of sample in X-ray fluorescence spectroscopy. The generated X-ray intensity…
Official abstracts site for the European Microscopy Congress