The 16th European Microscopy Congress 2016
Lateral resolution of quantitative element analysis of low-Z elements
1. Center for Electron Microscopy (ZELMI), Technische Universität Berlin, Berlin, Allemagne
This work is a continuation of the investigation of the lateral resolution for quantitative analysis in a field emission electron probe microanalyser (FE-EPMA) [1]. Now,…The 16th European Microscopy Congress 2016
The analysis of Mo5SiB2 in the SEM with the use of EDS and WDS
Refractory metals and their alloys show potential for high temperature applications due to their increased melting point and creep resistance. Mo-Si-B ternary alloys consisting of…The 16th European Microscopy Congress 2016
Deconvolution of EDS steel spectra using low acceleration voltages and low energy X-ray lines
One of the most important materials used in industry is steel. Its fine microstructure consisting of different phases and inclusions, has led to the development…
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