The 16th European Microscopy Congress 2016
Electron beam lithography for the realization of electron beam vortices with large topological charge ( L=1000ħ)
Electron vortex beams (EVBs) are an appealing topic, both in fundamental science and for practical applications in electron microscopy [1, 2]. Some of the most…The 16th European Microscopy Congress 2016
The measurement of off-plane magnetic field through electron vortex beams
It is well known that a magnetic field produces a phase change proportional to the in plane magnetic field B [1]. Alas the out of…The 16th European Microscopy Congress 2016
Elastic delocalization in EELS
Inelastic delocalization – caused by the long-ranged Coulomb interaction – is a well-known phenomenon in EELS that limits the achievable spatial resolution [1]. For low-loss…