The 16th European Microscopy Congress 2016
Scanning Probe Microscopy goes Live: seeing dynamic phenomena with STM
1. Advanced Research Center for Nanolithography, ., Amsterdam, Pays-Bas
Scanning Tunneling Microscopy (STM) and other forms of Scanning Probe Microscopy (SPM), are traditionally applied mainly to static structures that are investigated mainly under relatively…The 16th European Microscopy Congress 2016
Novel Linkage Technology of the Shared Alignment Sample Holder for Same Area Observations with Electron Microscopy and Scanning Probe Microscopy
We developed an innovative air protection sample holder enabling a hermeneutically sealed sample transfer from Hitachi’s ion milling instrument to the Field Emission Scanning…
Official abstracts site for the European Microscopy Congress