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Articles tagged "Scanning Probe Microscopy"

  • The 16th European Microscopy Congress 2016

    Scanning Probe Microscopy goes Live: seeing dynamic phenomena with STM

    Joost Frenken (1)

    1. Advanced Research Center for Nanolithography, ., Amsterdam, Pays-Bas

    Scanning Tunneling Microscopy (STM) and other forms of Scanning Probe Microscopy (SPM), are traditionally applied mainly to static structures that are investigated mainly under relatively…

  • The 16th European Microscopy Congress 2016

    Novel Linkage Technology of the Shared Alignment Sample Holder for Same Area Observations with Electron Microscopy and Scanning Probe Microscopy

    Ulrich Diestelhorst (1), Takehiro Yamaoka (1), Kazunori Ando (2), Yoichiro Hashimoto (3)

    1. Analytical Application Engineering Section Tokyo 2, Hitachi High-Tech Science Corporation, Kawasaki, Japon 2. Analytical Instruments Engineering Dept., Hitachi High-Tech Science Corporation, Oyama, Japon 3. Application Development Dept., Hitachi High-Technologies Corporation, Hitachinaka, Japon

        We developed an innovative air protection sample holder enabling a hermeneutically sealed sample transfer from Hitachi’s ion milling instrument to the Field Emission Scanning…