The 16th European Microscopy Congress 2016
Direct estimation of 3D atom positions of simulated Au nanoparticles in HAADF STEM
The most commonly used algorithms to reconstruct HAADF STEM data such as Filtered Back Projection (FBP) and iterative reconstruction algorithms such as ART, SART and…The 16th European Microscopy Congress 2016
Depth Dependence of the Spatial Resolution in Scanning Transmission Electron Microscopy Experiments
Annular dark field scanning transmission electron microscopy (STEM) is capable of imaging thick specimens. The capability to image thick specimens is relevant, for example, for…The 16th European Microscopy Congress 2016
A New Compound Lens Equipped UHR SEM.
1. FEI, Brno, République tchèque 2. FEI, Eindhoven, Pays-Bas
The quality of a scanning electron micrograph is determined by both the resolution and the contrast: the size of the features that can be resolved…
Official abstracts site for the European Microscopy Congress