EMC Abstracts

Official abstracts site for the European Microscopy Congress

MENU 
  • Home
  • Meetings Archive
    • The 16th European Microscopy Congress 2016
  • Keyword Index
  • Your Favorites
    • Favorites
    • Login
    • Register
    • View and Print All Favorites
    • Clear all your favorites
  • Advanced Search

Articles tagged "orientation imaging"

  • The 16th European Microscopy Congress 2016

    Nanoscale Crystal Cartography using Scanning Electron Diffraction

    Paul Midgley (1), Duncan Johnstone (1), Sung-Jin Kang (1), Alex Eggeman (1)

    1. Department of Materials Science and Metallurgy, University of Cambridge, Cambridge, Royaume Uni

    Electron diffraction, and its use to study the nanoscale crystallography of materials, has had something of a renaissance in recent years. The ease with which…
  • The 16th European Microscopy Congress 2016

    Crystallographic mapping in engineering alloys by scanning precession electron diffraction

    Duncan N. Johnstone (1), Alexander J. Knowles (2), Robert Krakow (1), Sigurd Wenner (3), Antonius T. J. van Helvoort (3), Randi Holmestad (3), Howard Stone (1), Catherine Rae (1), Paul A. Midgley (1)

    1. Department of Materials Science & Metallurgy, University of Cambridge, Cambridge, Royaume Uni 2. Department of Materials, Imperial College London, London, Royaume Uni 3. Department of Physics, NTNU, Trondheim, Norvège

    Crystallographic, compositional and morphological complexity in modern engineering alloys necessitates the use of sophisticated tools for multi-scale materials characterisation. Here, we develop scanning precession electron…

Most Viewed Abstracts

  • mScarlet, a novel high quantum yield (71%) monomeric red fluorescent protein with enhanced properties for FRET- and super resolution microscopy
  • 3D structure and chemical composition reconstructed simultaneously from HAADF-STEM images and EDS-STEM maps
  • Pixelated STEM detectors: opportunities and challenges
  • Atomic relaxation in ultrathin fcc metal nanowires
  • Layer specific optical band gap measurement at nanoscale in MoS2 and ReS2 van der Waals compounds by high resolution electron energy loss spectroscopy

Your Favorites

You can save and print a list of your favorite abstracts by clicking the “Favorite” button at the bottom of any abstract. View your favorites »

Visit Our Partner Sites

The 16th European Microscopy Congress

The official web site of the 16th European Microscopy Congress.

European Microscopy Society

European Microscopy Society logoThe European Microscopy Society (EMS) is committed to promoting the use and the quality of advanced microscopy in all its aspects in Europe.

International Federation of Societies for Microscopy

International Federation of Societies for Microscopy logoThe IFSM aims to contribute to the advancement of microscopy in all its aspects.

Société Française des Microscopies

Société Française des MicroscopiesThe Sfµ is a multidisciplinary society which aims to improve and spread the knowledge about Microscopy.

Connect with us

Imaging & Microscopy
Official Media Partner of the European Microscopy Society.

  • Help & Support
  • About Us
  • Cookies & Privacy
  • Wiley Job Network
  • Terms & Conditions
  • Advertisers & Agents
Copyright © 2021 John Wiley & Sons, Inc. All Rights Reserved.
Wiley
This site uses cookies: Find out more.