The 16th European Microscopy Congress 2016
How precise can atoms of a nanocluster be positioned in 3D from a tilt series of scanning transmission electron microscopy images?
Nanoclusters play key roles in a wide range of materials and devices because of their unique physical and chemical properties. These properties are determined by…The 16th European Microscopy Congress 2016
Non-destructive nanoparticle characterisation using a minimum electron dose in quantitative ADF STEM: how low can one go?
Aberration-corrected STEM has become a powerful technique for materials characterisation of complex nanostructures. Recent progress in the development of quantitative methods allows us to extract…The 16th European Microscopy Congress 2016
Optimal detectability combined with picometre range precision to position light atoms from HR STEM images
In the past few years a lot of research has been done to improve the imaging power to detect light atoms like oxygen, lithium, and…