The 16th European Microscopy Congress 2016
In situ TEM observation of electromigration in Ni nanobridges
1. HREM, Kavli Institute of Nanoscience, Delft University of Technology, Delft, Pays-Bas
Using in situ scanning transmission electron microscopy (STEM) (FEI Titan microscope operating at 300 keV), a microelectromechanical system (MEMS) chip and a dedicated biasing and heating…The 16th European Microscopy Congress 2016
Investigation of plasticity/fatigue mechanisms at interfaces in Ni using ex-situ and in-situ SEM/TEM micro/nano-mechanical testing
The present work focuses on the fundamental plasticity/fatigue mechanisms operating at interfaces in micro/nano scale Ni samples. In-situ SEM fatigue tests have been performed on FIB prepared…
Official abstracts site for the European Microscopy Congress