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The 16th European Microscopy Congress 2016
Pixelated STEM detectors: opportunities and challenges
1. School of Physics and Astronomy, University of Glasgow, Glasgow, Royaume Uni 2. Institute of Ion Beam Physics and Materials Research , Helmholtz-Zentrum Dresden-Rossendorf, Dresden, Allemagne 3. School of Engineering, University of Glasgow, Glasgow, Royaume Uni
Conventionally, imaging in Scanning Transmission Electron Microscopy (STEM) has been performed using annular detectors that integrate up large fractions of the scattered electrons into a…
