Official abstracts site for the European Microscopy Congress
Official abstracts site for the European Microscopy Congress
The 16th European Microscopy Congress 2016
Sergio SAO JOAO (1), Omar MEKNI (1), Dominique GOEURIOT (1), Gilles DAMAMME (2)
Dielectric breakdown constitute an important limitation in the use of insulating materials since it causes its damage. This catastrophic phenomenon (Figure 1) is obviously an…