The 16th European Microscopy Congress 2016
Defocus and probe-position coupling in electron ptychography
Defocus and probe-position coupling in electron ptychography Shaohong Cao, Peng Li, Andrew M Maiden, John M Rodenburg Department of Electronic and Electrical Engineering, University of…The 16th European Microscopy Congress 2016
ISTEM: A Realisation of Incoherent Imaging for Ultra-High Resolution TEM beyond the Classical Information Limit
The ISTEM (Imaging STEM) method [Phys. Rev Lett. 113, 096101(2014)] presented here constitutes a novel way for the realisation of TEM imaging with spatially incoherent…The 16th European Microscopy Congress 2016
Non-local averaging in EM: decreasing the required electron dose in crystal image reconstruction without losing spatial resolution
1. Graduate School AICES, RWTH Aachen University, Aachen, Allemagne
Todays electron microscopes enable imaging of materials at atomic resolution. However, in many relevant applications, the resolution is not limited by the microscope's physical properties,…The 16th European Microscopy Congress 2016
A closer look at high-resolution electron holography
1. Institut für Optik und Atomare Physik, Technische Universität Berlin, Berlin, Allemagne
In the recent years high-resolution off-axis electron holography made huge advancements. Electron microscopes with increased numbers of electron optical biprisms and electron lenses allow more…The 16th European Microscopy Congress 2016
Structural basis of Nanobody-mediated plant virus resistance and vector transmission revealed by cryo-EM.
Since their discovery, single-domain antigen-binding fragments of camelid-derived heavy chain-only antibodies, also known as Nanobodies (Nbs), have proven to be of outstanding interest as therapeutics…The 16th European Microscopy Congress 2016
Quantitative low-voltage spherical and chromatic aberration-corrected high-resolution TEM analysis of beam-specimen interactions in single-layer MoS2 and MoS2/graphene heterostructures
Sub-Angstrom resolution at medium accelerating voltages of 200-300 kV is routinely achieved in standard transmission electron microscopes by hardware correction of the spherical aberration of…
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