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Articles tagged "FIB"

  • The 16th European Microscopy Congress 2016

    3D investigation of a PS/ABS polymer using different microscopy techniques

    X. Jaurand (1), E. Errazuriz (2), S. Reynaud (3), Th. Douillard (4), F. Dalmas (4), S. Descartes (5), F. Simonet (6), M. Mondon (7), I. Anselme-Bertrand (8)

    1. Lyon BioImages, CTµ, Univ Lyon, UCB Lyon 1, Lyon, France 2. CIQLE, Univ Lyon, UCB Lyon 1, Lyon, France 3. LHC, UMR 5516, Univ Lyon, CNRS, Université J. Monnet, Saint-Etienne, France 4. MATEIS, UMR 5510, Univ Lyon, CNRS, INSA-Lyon, Lyon, France 5. LaMCoS UMR 5259, Univ Lyon, CNRS, INSA-Lyon, Lyon, France 6. IRCELyon, UMR 5256 , Univ Lyon, CNRS, UCB Lyon 1, Lyon, France 7. LGF, UMR 5307, Univ Lyon, CNRS, EMSE, Saint-Etienne, France 8. Faculté de médecine, Univ Lyon, Université J. Monnet, Saint-Etienne, France

    This study is developed in the framework of RéCaMiA, a French regional (Rhône-Alpes / Auvergne) microscopy network, which offers facilities through a panel of microscopes…
  • The 16th European Microscopy Congress 2016

    FIB and TEM study of nanometric tribofilm formed on stainless steel during fretting-impact tribologic tests in simulated Pressurized Water Reactor conditions

    Laurent LEGRAS (1), Jean-Louis MANSOT (2), Guillaume PERILLAT (1), Andi Mikosch Cuka (2)

    1. MMC, EDF R&D , Moret Sur Loing, France 2. C3MAG, Université des Antilles, Campus de Fouillole, Pointe à Pitre Guadeloupe, France

    Wear is one of the degradation mechanism observed on some component of PWR reactor. It was mainly studied based on wear tests in various conditions…
  • The 16th European Microscopy Congress 2016

    In situ tensile testing of silica glass membranes in the TEM

    Mirza Mačković (1), Hana Stara (1), Thomas Przybilla (1), Christel Dieker (1), Florian Niekiel (1), Patrick Herre (2), Stefan Romeis (2), Nadine Schrenker (1), Wolfgang Peukert (2), Erdmann Spiecker (1)

    1. Institute of Micro- and Nanostructure Research and Center for Nanoanalysis and Electron Microscopy, University of Erlangen-Nürnberg, Erlangen, Allemagne 2. Institute of Particle Technology (LFG), University of Erlangen-Nürnberg, Erlangen, Allemagne

    Increasing research on strength of glasses, which was greatly influenced by Griffith [1], has spawn strengthening strategies such as topological engineering [2]. Pioneering works by…
  • The 16th European Microscopy Congress 2016

    Towards Conductivity Measurements in Battery Materials Using Scanning Electron Microscopy

    Sebastian Sturn (1), Ute Golla-Schindler (1, 2), Jörg Bernhard (1), Manfred Rapp (3), Mario Wachtler (3), Ute Kaiser (1)

    1. Central Facility for Electron Microscopy, Group of Electron Microscopy of Materials Science, Ulm University, Ulm, Allemagne 2. Material Research Institue (IMFAA), Aalen University, Aalen, Allemagne 3. Zentrum für Sonnenenergie- und Wasserstoff-Forschung, ZSW, Ulm, Allemagne

    There are several ways of determining the conductivity of bulk materials, especially known in the field of solid state physics [1]. The most commonly used…
  • The 16th European Microscopy Congress 2016

    Automatic FIB-SEM Preparation of Straight Pillars for In-Situ Nanoindentation

    Tobias Volkenandt (1), Alexandre Laquerre (2), Michal Postolski (1), Fabián Pérez-Willard (1)

    1. Carl Zeiss Microscopy GmbH, Oberkochen, Allemagne 2. Fibics Incorporated, Ottawa, Canada

    In-situ indentation tests in FIB-SEMs are a powerful tool to characterize the mechanical deformation properties of matter at the micron scale [1,2]. FIB milling is…
  • The 16th European Microscopy Congress 2016

    In situ compression experiments of fused silica pillars in the TEM and SEM

    Mirza Mačković (1), Thomas Przybilla (1), Patrick Herre (2), Stefan Romeis (2), Jonas Paul (2), Etienne Barthel (3), Jeremie Teisseire (4), Nadine Schrenker (1), Wolfgang Peukert (2), Erdmann Spiecker (1)

    1. Institute of Micro- and Nanostructure Research and Center for Nanoanalysis and Electron Microscopy, University of Erlangen-Nürnberg, Erlangen, Allemagne 2. Institute of Particle Technology (LFG), University of Erlangen-Nürnberg, Erlangen, Allemagne 3. Institute de physique, Centre national de la recherche scientifique (CNRS), Paris, France 4. Surface du Verre et Interfaces, Centre national de la recherche scientifique (CNRS) Saint-Gobain, Aubervilliers, France

    While fused silica is known for its brittleness on macroscopic scale [1], it exhibits an amount of plasticity on microscale [2]. Thermally-treated Stöber-Fink-Bohn (SFB)-type silica…
  • The 16th European Microscopy Congress 2016

    Helios G4: Combination of ultrathin damage-free TEM sample preparation and high-resolution STEM imaging in a single instrument

    Jan Skalicky (1), Tomas Vystavel (1), Lubomir Tuma (1), Richard Young (2)

    1. Research & Development, FEI Company, Vlastimila Pecha 1282/12, 627 00 Brno, République tchèque 2. Research & Development, FEI Company, 5350 NE Dawson Creek Drive, Hillsboro, OR 97124, Etats-Unis

    Development in semiconductor industry as well as in materials research has lead to a further decrease in observed features sizes. STEM in SEM imaging has…
  • The 16th European Microscopy Congress 2016

    Principle component analysis applied to high resolution cross sectional STEM imaging: Quantitative analysis of 2D heterostructures

    Aidan Rooney (1), Aleksey Kozikov (2), Eric Prestat (1), Freddie Withers (2), Andre Geim (2), Konstantin Novoselov (2), Sarah Haigh (1)

    1. School of Materials, University of Manchester, Manchester, Royaume Uni 2. School of Physics and Astronomy, University of Manchester, Manchester, Royaume Uni

    Monolayers of 2D transition metal dichalcogenides (TMDCs) provide excellent semiconductingcounterparts to insulating hexagonal boron nitride (hBN) and conductive graphene.[1] Combining allthree materials in a Van…
  • The 16th European Microscopy Congress 2016

    Preparation of high fidelity holographic vortex masks using advanced FIB milling strategies

    Thomas Schachinger (1, 2), Andreas Steiger-Thirsfeld (2), Stefan Löffler (2, 3), Michael Stöger-Pollach (2, 1), Sebastian Schneider (4), Darius Pohl (4), Bernd Rellinghaus (4), Peter Schattschneider (1, 2)

    1. Institute of Solid State Physics, Vienna University of Technology, Vienna, Autriche 2. USTEM, Vienna University of Technology, Vienna, Autriche 3. Department of Materials Science and Engineering, McMaster, Hamilton, Canada 4. Institute for Metallic Materials, IFW Dresden, Dresden, Allemagne

    Holographic masks (HMs) with dislocation gratings placed in the condenser system of a TEM have been proven to be a reliable and robust method to…
  • The 16th European Microscopy Congress 2016

    Concepts for an electrostatic phase shifting device

    Tolga Wagner (1), Tore Niermann (1), Dirk Berger (2), Michael Lehmann (1)

    1. Technische Universität Berlin, Institut für Optik und Atomare Physik, Straße des 17. Juni 135, Sekr. ER 1-1, 10623 Berlin, Allemagne 2. Technische Universität Berlin, ZE Elektronenmikroskopie (ZELMI), Straße des 17. Juni 135, Sekr. KWT 2 , 10623 Berlin, Allemagne

    The advantage of providing amplitude and phase information of an object exit-wave makes off-axis electron holography a powerful tool for analyzing field and potential distributions…
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