The 16th European Microscopy Congress 2016
3D investigation of a PS/ABS polymer using different microscopy techniques
This study is developed in the framework of RéCaMiA, a French regional (Rhône-Alpes / Auvergne) microscopy network, which offers facilities through a panel of microscopes…The 16th European Microscopy Congress 2016
FIB and TEM study of nanometric tribofilm formed on stainless steel during fretting-impact tribologic tests in simulated Pressurized Water Reactor conditions
Wear is one of the degradation mechanism observed on some component of PWR reactor. It was mainly studied based on wear tests in various conditions…The 16th European Microscopy Congress 2016
In situ tensile testing of silica glass membranes in the TEM
Increasing research on strength of glasses, which was greatly influenced by Griffith [1], has spawn strengthening strategies such as topological engineering [2]. Pioneering works by…The 16th European Microscopy Congress 2016
Towards Conductivity Measurements in Battery Materials Using Scanning Electron Microscopy
There are several ways of determining the conductivity of bulk materials, especially known in the field of solid state physics [1]. The most commonly used…The 16th European Microscopy Congress 2016
Automatic FIB-SEM Preparation of Straight Pillars for In-Situ Nanoindentation
1. Carl Zeiss Microscopy GmbH, Oberkochen, Allemagne 2. Fibics Incorporated, Ottawa, Canada
In-situ indentation tests in FIB-SEMs are a powerful tool to characterize the mechanical deformation properties of matter at the micron scale [1,2]. FIB milling is…The 16th European Microscopy Congress 2016
In situ compression experiments of fused silica pillars in the TEM and SEM
While fused silica is known for its brittleness on macroscopic scale [1], it exhibits an amount of plasticity on microscale [2]. Thermally-treated Stöber-Fink-Bohn (SFB)-type silica…The 16th European Microscopy Congress 2016
Helios G4: Combination of ultrathin damage-free TEM sample preparation and high-resolution STEM imaging in a single instrument
Development in semiconductor industry as well as in materials research has lead to a further decrease in observed features sizes. STEM in SEM imaging has…The 16th European Microscopy Congress 2016
Principle component analysis applied to high resolution cross sectional STEM imaging: Quantitative analysis of 2D heterostructures
Monolayers of 2D transition metal dichalcogenides (TMDCs) provide excellent semiconductingcounterparts to insulating hexagonal boron nitride (hBN) and conductive graphene.[1] Combining allthree materials in a Van…The 16th European Microscopy Congress 2016
Preparation of high fidelity holographic vortex masks using advanced FIB milling strategies
Holographic masks (HMs) with dislocation gratings placed in the condenser system of a TEM have been proven to be a reliable and robust method to…The 16th European Microscopy Congress 2016
Concepts for an electrostatic phase shifting device
The advantage of providing amplitude and phase information of an object exit-wave makes off-axis electron holography a powerful tool for analyzing field and potential distributions…
Official abstracts site for the European Microscopy Congress