EMC Abstracts

Official abstracts site for the European Microscopy Congress

MENU 
  • Home
  • Meetings Archive
    • The 16th European Microscopy Congress 2016
  • Keyword Index
  • Your Favorites
    • Favorites
    • Login
    • Register
    • View and Print All Favorites
    • Clear all your favorites
  • Advanced Search

Articles tagged "electrostatic potential"

  • The 16th European Microscopy Congress 2016

    Quantitative measurements of nanoscale electrostatic and mean inner potentials in crystals by electron beam refraction using CBED and DPC

    Mingjian Wu (1), Erdmann Spiecker (1)

    1. Institute for Micro- and Nanostructure Research & Center for Nanoanalysis and Electron Microscopy (CENEM), FAU Erlangen-Nuremberg, Erlangen, Allemagne

    Probing nanometer scale electrostatic and mean inner potential (MIP) and establishing structure–properties relationship at this length scale in advanced functional materials are not only of…
  • The 16th European Microscopy Congress 2016

    Split-illumination Electron Holography Applied to Electrostatic Potential Analyses of Oxide Heterojunctions with Polar Discontinuity

    Toshiaki Tanigaki (1), Masao Nakamura (2), Fumitaka Kagawa (2), Hyun Soon Park (2), Tsuyoshi Matsuda (3), Daisuke Shindo (2, 4), Yoshinori Tokura (2, 5), Masashi Kawasaki (2, 5)

    1. Research & Development Group, Hitachi, Ltd., Hatoyama, Japon 2. Center for Emergent Matter Science (CEMS), RIKEN, Wako, Japon 3. Japan Science and Technology Agency (JST), Kawaguchi, Japon 4. Institute of Multidisciplinary Research for Advanced Materials, Tohoku University, Sendai, Japon 5. Department of Applied Physics and Quantum-Phase Electron Center, University of Tokyo, Tokyo, Japon

       Electron holography using interference of electron wave is one of quantitative microscopic techniques to visualize electromagnetic fields at nanometer scale. The long standing problem…

Most Viewed Abstracts

  • mScarlet, a novel high quantum yield (71%) monomeric red fluorescent protein with enhanced properties for FRET- and super resolution microscopy
  • 3D structure and chemical composition reconstructed simultaneously from HAADF-STEM images and EDS-STEM maps
  • Layer specific optical band gap measurement at nanoscale in MoS2 and ReS2 van der Waals compounds by high resolution electron energy loss spectroscopy
  • Pixelated STEM detectors: opportunities and challenges
  • Developments in unconventional dark field TEM for characterising nanocatalyst systems

Your Favorites

You can save and print a list of your favorite abstracts by clicking the “Favorite” button at the bottom of any abstract. View your favorites »

Visit Our Partner Sites

The 16th European Microscopy Congress

The official web site of the 16th European Microscopy Congress.

European Microscopy Society

European Microscopy Society logoThe European Microscopy Society (EMS) is committed to promoting the use and the quality of advanced microscopy in all its aspects in Europe.

International Federation of Societies for Microscopy

International Federation of Societies for Microscopy logoThe IFSM aims to contribute to the advancement of microscopy in all its aspects.

Société Française des Microscopies

Société Française des MicroscopiesThe Sfµ is a multidisciplinary society which aims to improve and spread the knowledge about Microscopy.

Connect with us

Imaging & Microscopy
Official Media Partner of the European Microscopy Society.

  • Help & Support
  • About Us
  • Cookie Preferences
  • Cookies & Privacy
  • Wiley Job Network
  • Terms & Conditions
  • Advertisers & Agents
Copyright © 2023 John Wiley & Sons, Inc. All Rights Reserved.
Wiley