The 16th European Microscopy Congress 2016
A closer look at high-resolution electron holography
1. Institut für Optik und Atomare Physik, Technische Universität Berlin, Berlin, Allemagne
In the recent years high-resolution off-axis electron holography made huge advancements. Electron microscopes with increased numbers of electron optical biprisms and electron lenses allow more…The 16th European Microscopy Congress 2016
Three-dimensional core-shell ferromagnetic nanowires fabricated by focused electron beam induced deposition
Functional nanostructured materials often rely on the combination of more than one material to confer the desired functionality or an enhanced performance of the devices.…The 16th European Microscopy Congress 2016
New design of Möllenstedt electrostatic biprism setup for off-axis electron holography
1. CEMES, CNRS, Toulouse, France
Many different forms of electron holography have been explored or imagined. The off-axis configuration that uses a post-specimen electrostatic Möllenstedt biprism (BP) is the most…The 16th European Microscopy Congress 2016
Generation with phase-and-amplitude electron holograms of Laguerre-Gauss beams with orbital angular momentum up to 200ħ
Phase-and-amplitude electron holograms provide a flexible way to encode an arbitrary wavefunction by modulating only the hologram phase [1] [2]. This is an innovative step…The 16th European Microscopy Congress 2016
Mapping electrostatic potentials across the p-n junction in GaAs nanowires by off-axis electron holography
The development of III−V materials on Si platforms, with the aim of reducing production costs while achieving high conversion efficiency, has been a continuing area…The 16th European Microscopy Congress 2016
Diffraction holography for the phase retrieval of vortex beams
The problem of phase retrieval in electron microscopy is generally related to the characterization of electric and magnetic fields in materials, to the retrieval of…The 16th European Microscopy Congress 2016
Analysis of GaAs compound semiconductors and the semiconductor laser diode using electron holography, Lorentz microscopy, electron diffraction microscopy and differential phase contrast STEM.
In order to develop and manufacture semiconductor devices which are key components of the optical telecommunication products, such as the semiconductor laser diode, it is…The 16th European Microscopy Congress 2016
Direct comparison of differential phase contrast and off-axis electron holography for the measurement of electric potentials by the examination of reverse biased Si p-n junctions and III-V samples.
In this presentation we will compare differential phase contrast (DPC) [1] and off-axis electron holography [2] for the measurement of electrostatic potentials in semiconductor devices.…The 16th European Microscopy Congress 2016
Remnant states and magnetic coupling in Co/Cu multilayered nanowires observed by electron holography
Magnetic nanowires (NWs) are of great interest due to their potential applications in technological devices and fundamental analysis in the spintronic field[1]–[3]. Among the wide…The 16th European Microscopy Congress 2016
Inside a FeRh layer during the ferromagnetic/antiferromagnetic transition: a quantitative study by off-axis electron holography
1. CEMES, CNRS/University of Toulouse, Toulouse, France
The ordered FeRh alloy presents very intriguing magnetic properties, among which a remarkable magnetic phase transition from an antiferromagnetic (AF) state at low temperature to…
Official abstracts site for the European Microscopy Congress