Articles tagged "electron beam irradiation sensitive"

The 16th European Microscopy Congress 2016
Improvement of a 40-120 kV analytical TEM system for electron beam irradiation sensitive nano materials
Toshie Yaguchi (1), Keiji Tamura (1), Takashi Kubo (1), Masaki Kondo (1), Hiromi Mise (2), Hiroaki Matsumoto (3)
1. Electron Microscope Systems Design 2nd Dept., Hitachi High-Technologies Corp., Hitachinaka-shi, Japon 2. Electron Microscope Systems Design 1st Dept., Hitachi High-Technologies Corp., Hitachinaka-shi, Japon 3. Application Development Dept., Hitachi High-Technologies Corp., Hitachinaka-shi, Japon
The performance of advanced nanomaterials such as the electrode catalysts of fuel cells is closely related to their composition, morphology and crystal structure. At the…