Articles tagged "electron beam induced current"

The 16th European Microscopy Congress 2016
SEM based electro-optical characterization of core-shell LEDs and simulation of imaging including CL and EBIC excitation inside ensembles
Johannes Ledig (1), Carl Georg Frase (2), Frederik Steib (1), Jana Hartmann (1), Hergo-Heinrich Wehmann (1), Andreas Waag (1)
1. Institute of Semiconductor Technology and Laboratory for Emerging Nanometrology, TU Braunschweig, Braunschweig, Allemagne 2. AG 5.24 Modellierung Rastermikroskopie, Physikalisch-Technische Bundesanstalt, Braunschweig, Allemagne
Three dimensional (3D) nano- and microstructures (NAMs) are attracting a lot of attention and are discussed regarding several applications, especially in optoelectronics and sensors. For…