The 16th European Microscopy Congress 2016
In situ TEM observation of electromigration in Ni nanobridges
1. HREM, Kavli Institute of Nanoscience, Delft University of Technology, Delft, Pays-Bas
Using in situ scanning transmission electron microscopy (STEM) (FEI Titan microscope operating at 300 keV), a microelectromechanical system (MEMS) chip and a dedicated biasing and heating…
Official abstracts site for the European Microscopy Congress