The 16th European Microscopy Congress 2016
In situ electrical testing across nano-scale contact interfaces in the transmission electron microscope
Understanding the electrical properties of nanoscale contacts is paramount in small-scale devices, including probe-based microscopies [1], nanomanufacturing techniques [2] and micro/nano-electromechanical systems (M/NEMS) [3]. In…
Official abstracts site for the European Microscopy Congress