The 16th European Microscopy Congress 2016
Gas TEM holder for in-situ biasing and heating experiments.
1. Kavli Institute of Nanoscience, Delft University of Technology, Delft, Pays-Bas
We present our custom designed Gas Transmission Electron Microscopy (TEM) holder for in-situ electrical, gas and heating experiments. The holder is currently compatible with FEI…The 16th European Microscopy Congress 2016
In-situ electrical measurements of Graphene Nanoribbons fabricated through Scanning Transmission Electron Microscopy
1. Kavli Institute of Nanoscience, Delft University of Technology, Delft, Pays-Bas
We recently demonstrated a controllable and reproducible method to obtain suspended monolayer graphene nanoribbons with atomically defined edge shape [1]. Our method exploits the electron-beam…
Official abstracts site for the European Microscopy Congress