The 16th European Microscopy Congress 2016
Chromatic corrected EFTEM investigation on spinodal decomposition of TiAlN at 80 kV with PICO
Chromatic aberration (Cc) in the modern transmission electron microscopy (TEM) plays an important role with the advancement the resolution up to atomic level1. Correction of…The 16th European Microscopy Congress 2016
Performance of the SALVE III corrector for EFTEM applications
1. Research & Development, CEOS GmbH, Heidelberg, Allemagne
The Sub-Angstroem-Low-Voltage-Electron-Microscope (SALVE) corrector was designed and built by the CEOS GmbH for the SALVE III project [1], a joined project of the group of…The 16th European Microscopy Congress 2016
Revealing the Morphology of Organic Bulk Heterojunction Solar Cells Using EFTEM and Low-Energy STEM
The morphology of organic bulk heterojunction (BHJ) solar cells decisively influences the device performance and efficiency and therefore is an important factor that needs to…The 16th European Microscopy Congress 2016
Lanthanide distribution in NaLuF4:Gd,Yb,Er upconversion nanocrystals by EFTEM and EELS
1. Department of Chemistry, University of Toronto, Toronto, Canada
Lanthanide-doped nanoparticles (NPs) have gained interest within the last decade due to their photon upconversion properties. Upconversion is a multi-photon process in which two or…The 16th European Microscopy Congress 2016
Mapping the plasmonic modes of silver nanoparticle aggregates
The optical properties of the noble metal nanoparticles (NPs) are dominated by localized surface plasmon resonances (LSPR) [1]. A spherical NP suspended in vacuum would…The 16th European Microscopy Congress 2016
EFTEM measurements of the sp2/sp3 ratio on SiC/SiC pyrolytic carbon interphases before and after irradiation
We investigated the behaviour of a specific component of silicon carbide based ceramic matrix composites (SiC/SiC) under irradiation, namely the pyrolytic carbon (PyC) interphase linking…