The 16th European Microscopy Congress 2016
Discrete STEM/EDX tomography for quantitative 3D reconstructions of chemical nanostructures
We report here on the quantitative 3D reconstruction of core-shell nanostructures by STEM/EDX using two X-ray maps acquired at two different tilt angles perpendicular to…The 16th European Microscopy Congress 2016
Structure characteristic of Ni-poly-p-xylylene nanocomposites synthesized by VDP
The simplicity of synthesis of polymer nanocomposites together with elasticity and plasticity, make these materials attractive in the aspect of possible applications for different application,…The 16th European Microscopy Congress 2016
In situ observation of heat-induced degradation of perovskite solar cells
The use of perovskite materials (particularly methylammonium lead iodide) in solar cells has become very attractive due to the fast increase in reported power conversion…The 16th European Microscopy Congress 2016
Improved Quantitative Compositional Analysis of γ’ and γ’’ in Additively Manufactured Alloy 718 Using STEM X-ray Energy Dispersive Spectrometry
Selective laser melting (SLM) is an additive manufacturing technique where successive laser beam passes are used to melt metal powder which forms a solid layer…The 16th European Microscopy Congress 2016
Cobalt-cerium coating formation: from ESEM to TEM analyses
Fuel cells are promising devices for clean energy conversion. In particular, Solid Oxide Fuel Cells (SOFC) convert natural gas and biogas into electricity and…The 16th European Microscopy Congress 2016
The oxidation of gallium (II) sulphide
Introdution Gallium (II) sulphide (GaS) is a III-VI layered semiconductor, which has recently been exfoliated using liquid-phase exfoliation. As a wide-gap semiconductor it has potential…The 16th European Microscopy Congress 2016
In-situ propagation of Al in germanium nanowires observed by transmission electron microscopy
Semiconductor nanowires (NWs) are promising candidates for many device applications ranging from electronics and optoelectronics to energy conversion and spintronics. However, typical NW devices are…The 16th European Microscopy Congress 2016
Quantification of the HAADF contrast from the nanometer scale down to the single atomic column: application to quantum cascade lasers
The emission wavelength of quantum cascade lasers can potentially be continuously tuned from the short (2µm) to the long (15µm) infrared, making them an ideal…The 16th European Microscopy Congress 2016
Aberration Corrected Analytical Scanning and Transmission Electron Microscope for High-Resolution Imaging and Analysis for Multi-User Facilities
1. Science & Medical Systems Business Group, Hitachi High-Technologies Corp., Ibaraki, Japon
In recent years the revolution in aberration correction technology has made ultrahigh resolution imaging and analysis routinely accessible on transmission electron microscope (TEM) and scanning…The 16th European Microscopy Congress 2016
Defect Investigation by Atomic-Resolution STEM of III-V Horizontal Nanowires grown via Template-Assisted Selective area Epitaxy
Scaling of silicon microelectronics is reaching fundamental physical limitations related in particular to the power consumption. A possible solution is represented by III-V semiconductors integrated…
Official abstracts site for the European Microscopy Congress