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Articles tagged "EDX"

  • The 16th European Microscopy Congress 2016

    Discrete STEM/EDX tomography for quantitative 3D reconstructions of chemical nanostructures

    Eric Robin (1), Miguel Lopez-Haro (2), Nicolas Mollard (1), Pamela Rueda-Fonseca (1, 3), Marta Orru (1, 3), Edith Bellet-Amalric (1), Yann Genuist (3), Regis Andre (3), Alberto Artioli (3), Serge Tatarenko (3), David Ferrand (3), Joel Cibert (3), Khalil El Hajraoui (3), Martien Den Hertog (3), Thibault Cremel (1), Kuntheak Kheng (1), Laure Guetaz (4)

    1. University Grenoble Alpes, INAC, CEA, Grenoble, France 2. Inorganic chemistry department, University of Cadiz, Cadiz, Espagne 3. University Grenoble Alpes, Neel, CNRS, Grenoble, France 4. LITEN, CEA, Grenoble, France

    We report here on the quantitative 3D reconstruction of core-shell nanostructures by STEM/EDX using two X-ray maps acquired at two different tilt angles perpendicular to…
  • The 16th European Microscopy Congress 2016

    Structure characteristic of Ni-poly-p-xylylene nanocomposites synthesized by VDP

    Anton Orekhov (1, 2), Alexsander Vasiliev (1, 2), Sergey Ozerin (1, 3), Artem Vdovichenko (1), Sergey Chvalun (1, 3)

    1. NRC Kurchatov Institute, Moscow, Russie 2. Institute of Cristallography RAS, Moscow, Russie 3. N.S. Enikolopov Institute of Synthetic Polymer Materials RAS, Moscow, Russie

    The simplicity of synthesis of polymer nanocomposites together with elasticity and plasticity, make these materials attractive in the aspect of possible applications for different application,…
  • The 16th European Microscopy Congress 2016

    In situ observation of heat-induced degradation of perovskite solar cells

    Giorgio Divitini (1), Stefania Cacovich (1), Fabio Matteocci (2), Lucio Cina' (2), Aldo Di Carlo (2), Paul Midgley (1), Caterina Ducati (1)

    1. Department of Materials Science, University of Cambridge, Cambridge, Royaume Uni 2. Department of Electronic Engineering, University of Rome "Tor Vergata", Rome, Italie

    The use of perovskite materials (particularly methylammonium lead iodide) in solar cells has become very attractive due to the fast increase in reported power conversion…
  • The 16th European Microscopy Congress 2016

    Improved Quantitative Compositional Analysis of γ’ and γ’’ in Additively Manufactured Alloy 718 Using STEM X-ray Energy Dispersive Spectrometry

    C. Austin Wade (1, 2), Giacomo Bertali (1), Thijs Withaar (2), David Foord (3), Bert Freitag (2), Grace Burke (1)

    1. Materials Performance Centre, The University of Manchester, Manchester, Royaume Uni 2. FEI Company, Eindhoven, Pays-Bas 3. FEI Company, Hillsboro, Etats-Unis

    Selective laser melting (SLM) is an additive manufacturing technique where successive laser beam passes are used to melt metal powder which forms a solid layer…
  • The 16th European Microscopy Congress 2016

    Cobalt-cerium coating formation: from ESEM to TEM analyses

    Stéphane Poitel (1, 2), Jun Zhu (3), Cécile Hébert (1), Jan Van Herle (2), Marc Willinger (3)

    1. CIME, EPFL, Lausanne, Suisse 2. SCI-STI-JVH, EPFL, Lausanne, Suisse 3. Department of Inorganic Chemistry, Fritz Haber Institute of the Max-Planck-Society, Berlin, Allemagne

      Fuel cells are promising devices for clean energy conversion. In particular, Solid Oxide Fuel Cells (SOFC) convert natural gas and biogas into electricity and…
  • The 16th European Microscopy Congress 2016

    The oxidation of gallium (II) sulphide

    Edmund Long (1, 2), Clotilde Cucinotta (1, 2), Andrew Harvey (1, 2), Clive Downing (3), Stefano Sanvito (2, 1), Valeria Nicolosi (1, 4, 5)

    1. School of Physics, Trinity College Dublin, Dublin, Irlande 2. CRANN & AMBER, Trinity College Dublin, Dublin, Irlande 3. Advanced Microscopy Laboratory, Trinity College Dublin, Dublin, Irlande 4. School of Chemistry, Trinity College Dublin, Dublin, Irlande 5. CRANN & AMBER, Trinity College Dublin, D, Irlande

    Introdution Gallium (II) sulphide (GaS) is a III-VI layered semiconductor, which has recently been exfoliated using liquid-phase exfoliation. As a wide-gap semiconductor it has potential…
  • The 16th European Microscopy Congress 2016

    In-situ propagation of Al in germanium nanowires observed by transmission electron microscopy

    Khalil EL HAJRAOUI (1), Eric Robin (2), Miguel Lopez-Haro (3), Clemens Zeiner (4), Florian Brunbauer (4), Sébastian Kral (4), Alois Lugstein (4), Jean-Luc Rouvière (2), Martien Den Hertog (1)

    1. Institut Néel, Université Grenoble Alpes, CNRS , Grenoble, France 2. INAC / SP2M, Université Grenoble Alpes, CEA, Grenoble, France 3. Inorganic chemistry department, University of Cadiz, Cadiz, Espagne 4. Institute for solid state electronics, University of Technology, Vienna, Autriche

    Semiconductor nanowires (NWs) are promising candidates for many device applications ranging from electronics and optoelectronics to energy conversion and spintronics. However, typical NW devices are…
  • The 16th European Microscopy Congress 2016

    Quantification of the HAADF contrast from the nanometer scale down to the single atomic column: application to quantum cascade lasers

    Konstantinos Pantzas (1), Gilles Patriarche (1), Ludovic Largeau (1), Maria Amanti (2), Angela Vasanelli (2), Carlo Sirtori (2), Grégoire Beaudoin (1), Isabelle Sagnes (1)

    1. Laboratoire de Photonique et de Nanostructures, CNRS UPR 20, Université Paris Saclay, CNRS, Marcoussis, France 2. Université Paris Diderot, Sorbonne Paris Cité, Laboratoire Matériaux et Phénomènes Quantiques, CNRS, Paris, France

    The emission wavelength of quantum cascade lasers can potentially be continuously tuned from the short (2µm) to the long (15µm) infrared, making them an ideal…
  • The 16th European Microscopy Congress 2016

    Aberration Corrected Analytical Scanning and Transmission Electron Microscope for High-Resolution Imaging and Analysis for Multi-User Facilities

    Hiromi Inada (1), Yoshifumi Taniguchi (1), Takafumi Yotsuji (1), Keitaro Watanabe (1), Hirobumi Muto (1), Wataru Shimoyama (1), Hiroaki Matsumoto (1), Mitsuru Konno (1)

    1. Science & Medical Systems Business Group, Hitachi High-Technologies Corp., Ibaraki, Japon

    In recent years the revolution in aberration correction technology has made ultrahigh resolution imaging and analysis routinely accessible on transmission electron microscope (TEM) and scanning…
  • The 16th European Microscopy Congress 2016

    Defect Investigation by Atomic-Resolution STEM of III-V Horizontal Nanowires grown via Template-Assisted Selective area Epitaxy

    Nicolas Bologna (1, 2, 3), Moritz Knoedler (2, 3), Mattias Borg (4, 2), Davide Cutaia (2), Rolf Erni (1), Heike Riel (2), Marta Rossel D. (1, 2)

    1. Electron Microscopy Center, Empa, Dubendorf, Suisse 2. M.I.N.D., IBM ZRL, Ruschlikon, Suisse 3. Laboratoire des Matériaux Semiconducteurs, EPFL, Lausanne, Suisse 4. Electrical and Information Technology, Lund University, Lund, Suède

    Scaling of silicon microelectronics is reaching fundamental physical limitations related in particular to the power consumption. A possible solution is represented by III-V semiconductors integrated…
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