Articles tagged "EDX mapping"

The 16th European Microscopy Congress 2016
Microstructural evolution and thermal stability of nitride-based metal/semiconductor superlattices for thermoelectric and hard-coating applications
Magnus Garbrecht (1), Jeremy L. Schroeder (1), Lars Hultman (1), Jens Birch (1), Timothy D. Sands (2), Bivas Saha (3)
1. Thin Film Physics Division, Linköping University, Linköping, Suède 2. Bradley Department of Electrical and Computer Engineering and Department of Materials Science and Engineering, Virginia Tech, Blacksburg, Etats-Unis 3. Department of Materials Science and Engineering, University of California, Berkeley, Berkeley, Etats-Unis
A detailed analysis on the quality and microstructure of various metal/semiconductor superlattices employing HR(S)/TEM (high-resolution (scanning)/transmission electron microscopy) imaging and energy dispersive x-ray spectroscopy (EDX)…