The 16th European Microscopy Congress 2016
Multi-modal electron tomography for 3D spectroscopic analysis using limited projections
Electron tomography applied to spectroscopic signals in the scanning transmission electron microscope (STEM) offers the possibility for quantitative determination of structure-chemistry relationships with nanometre…The 16th European Microscopy Congress 2016
Measuring the number of layers in 2D materials with SEM and AFM
1. Oxford Instruments, High Wycombe, Royaume Uni 2. Oxford Instruments, Yatton, Royaume Uni
2D transition metal chalcogenides enable exciting new applications in electronic devices and show great promise to replace traditional silicon technology as functional building blocks [1].…The 16th European Microscopy Congress 2016
3D Elemental and interdependent reconstructions based on a novel compressed sensing algorithm in electron tomography
Electron Tomography (ET) is a key technique to perform 3D characterization at the nanometer scale [1]. 2D projections at different tilt…The 16th European Microscopy Congress 2016
Analytical electron microscopy characterization of light-emitting diodes based on ordered InGaN nanocolumns
Self-assembled nanocolumns (NCs) with InGaN/GaN disks constitute an alternative to conventional light emitting diodes (LED) planar devices [1]. However, their efficiency and reliability are hindered…The 16th European Microscopy Congress 2016
Aberration Corrected Analytical Scanning and Transmission Electron Microscope for High-Resolution Imaging and Analysis for Multi-User Facilities
1. Science & Medical Systems Business Group, Hitachi High-Technologies Corp., Ibaraki, Japon
In recent years the revolution in aberration correction technology has made ultrahigh resolution imaging and analysis routinely accessible on transmission electron microscope (TEM) and scanning…The 16th European Microscopy Congress 2016
Deconvolution of EDS steel spectra using low acceleration voltages and low energy X-ray lines
One of the most important materials used in industry is steel. Its fine microstructure consisting of different phases and inclusions, has led to the development…The 16th European Microscopy Congress 2016
Quantification of dopants in nanomaterial by SEM/EDS
It is long known that doping is a key element in the development of modern semiconductor technology for applications in electronic, nano-electronics, optoelectronics and photonics.…The 16th European Microscopy Congress 2016
Characterization of nanometric-sized participates formed during heat treatment of aluminium alloy with antimony
New requirements to be met by modern alloys requires changing the currently used materials. This is accomplished by the use of newer and newer generation…The 16th European Microscopy Congress 2016
Exposing New Atomic-scale Information about Materials by Improving the Quality and Quantifiability of Aberration-corrected STEM Data
Aberration-corrected scanning transmission electron microscopy (STEM) is providing previously unattainable views of materials at the atomic scale. The quality of STEM data is now often…The 16th European Microscopy Congress 2016
Progress in analysing lithium ion battery materials in the SEM
New and existing materials for lithium ion batteries are being studied extensively with the aim of increasing their storage capacity and lifetime. While the SEM…
Official abstracts site for the European Microscopy Congress