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Articles tagged "EDS"

  • The 16th European Microscopy Congress 2016

    Multi-modal electron tomography for 3D spectroscopic analysis using limited projections

    Sean Collins (1), Joshua Einsle (1, 2), Zineb Saghi (1, 3), Robert Blukis (2), Richard Harrison (2), Paul Midgley (1)

    1. Department of Materials Science and Metallurgy, University of Cambridge, 27 Charles Babbage Road, Cambridge, CB3 0FS, Royaume Uni 2. Department of Earth Sciences, University of Cambridge, Cambridge, Royaume Uni 3. Present address: CEA, LETI, MINATEC Campus, F-38054 Grenoble, France

         Electron tomography applied to spectroscopic signals in the scanning transmission electron microscope (STEM) offers the possibility for quantitative determination of structure-chemistry relationships with nanometre…
  • The 16th European Microscopy Congress 2016

    Measuring the number of layers in 2D materials with SEM and AFM

    Christian Lang (1), Matthew Hiscock (1), Ravi Sundaram (2), Jonathan Moffat (1), Kim Larsen (1)

    1. Oxford Instruments, High Wycombe, Royaume Uni 2. Oxford Instruments, Yatton, Royaume Uni

    2D transition metal chalcogenides enable exciting new applications in electronic devices and show great promise to replace traditional silicon technology as functional building blocks [1].…
  • The 16th European Microscopy Congress 2016

    3D Elemental and interdependent reconstructions based on a novel compressed sensing algorithm in electron tomography

    Tony Printemps (1, 2), Nicolas Bernier (1, 2), Eric Robin (1, 3), Zineb Saghi (1, 2), Lionel Hervé (1, 2)

    1. Univ. Grenoble Alpes, Grenoble F-38000, France 2. CEA, LETI, MINATEC Campus, Grenoble F-38054, France 3. CEA, INAC, MINATEC Campus, Grenoble F-38054, France

            Electron Tomography (ET) is a key technique to perform 3D characterization at the nanometer scale [1]. 2D projections at different tilt…
  • The 16th European Microscopy Congress 2016

    Analytical electron microscopy characterization of light-emitting diodes based on ordered InGaN nanocolumns

    Almudena Torres-Pardo (1), Žarko Gačević (2), Noemi García-Lepetit (2), Marcus Müller (3), Sebastian Metzner (3), Ana Bengoechea-Encabo (2), Steven Albert (2), Frank Bertram (3), Peter Veit (3), Juergen Christen (3), Enrique Calleja (2), Jose M. González-Calbet (1, 4)

    1. Departamento de Química Inorgánica I, Facultad de Químicas, Universidad Complutense CEI Moncloa, Madrid, Espagne 2. ISOM-ETSIT, Universidad Politécnica de Madrid, Madrid, Espagne 3. Institute of Experimental Physics, Otto-von-Guericke-University Magdeburg, Magdeburg, Allemagne 4. ICTS Centro Nacional de Microscopía Electrónica, Universidad Complutense CEI Moncloa, Madrid, Espagne

    Self-assembled nanocolumns (NCs) with InGaN/GaN disks constitute an alternative to conventional light emitting diodes (LED) planar devices [1]. However, their efficiency and reliability are hindered…
  • The 16th European Microscopy Congress 2016

    Aberration Corrected Analytical Scanning and Transmission Electron Microscope for High-Resolution Imaging and Analysis for Multi-User Facilities

    Hiromi Inada (1), Yoshifumi Taniguchi (1), Takafumi Yotsuji (1), Keitaro Watanabe (1), Hirobumi Muto (1), Wataru Shimoyama (1), Hiroaki Matsumoto (1), Mitsuru Konno (1)

    1. Science & Medical Systems Business Group, Hitachi High-Technologies Corp., Ibaraki, Japon

    In recent years the revolution in aberration correction technology has made ultrahigh resolution imaging and analysis routinely accessible on transmission electron microscope (TEM) and scanning…
  • The 16th European Microscopy Congress 2016

    Deconvolution of EDS steel spectra using low acceleration voltages and low energy X-ray lines

    Ralf Terborg (1), Tobias Salge (2), Philippe Pinard (3), Silvia Richter (3)

    1. Bruker Nano GmbH, Berlin, Allemagne 2. Core Research Laboratories, Natural History Museum, London, Royaume Uni 3. Central Facility for Electron Microscopy, RWTH Aachen University, Aachen, Allemagne

    One of the most important materials used in industry is steel. Its fine microstructure consisting of different phases and inclusions, has led to the development…
  • The 16th European Microscopy Congress 2016

    Quantification of dopants in nanomaterial by SEM/EDS

    Eric Robin (1), Nicolas Mollard (1), Kevin Guilloy (1), Nicolas Pauc (1), Pascal Gentile (1), Zhihua Fang (1), Bruno Daudin (1), Lynda Amichi (1), Pierre-Henri Jouneau (1), Catherine Bougerol (2), Michael Delalande (3), Anne-Laure Bavencove (3)

    1. University Grenoble Alpes, INAC, CEA, Grenoble, France 2. University Grenoble Alpes, Neel, CNRS, Grenoble, France 3. ALEDIA, Grenoble, France

    It is long known that doping is a key element in the development of modern semiconductor technology for applications in electronic, nano-electronics, optoelectronics and photonics.…
  • The 16th European Microscopy Congress 2016

    Characterization of nanometric-sized participates formed during heat treatment of aluminium alloy with antimony

    Krzysztof Matus (1), Klaudiusz Gołombek (1), Mirosława Pawlyta (1)

    1. Institute of Engineering Materials and Biomaterials, Silesian University of Technology, Gliwice, Pologne

    New requirements to be met by modern alloys requires changing the currently used materials. This is accomplished by the use of newer and newer generation…
  • The 16th European Microscopy Congress 2016

    Exposing New Atomic-scale Information about Materials by Improving the Quality and Quantifiability of Aberration-corrected STEM Data

    Andrew Yankovich (1), Torben Pingel (1), Jie Feng (2), Alex Kvit (2), Thomas Slater (3), Sarah Haigh (3), Dane Morgan (2), Paul Voyles (2), Eva Olsson (1)

    1. Department of Physics, Chalmers University, Gothenburg, Suède 2. Materials Science and Engineering, University of Wisconsin Madison, Madison, Etats-Unis 3. School of Materials, University of Manchester, Manchester, Royaume Uni

    Aberration-corrected scanning transmission electron microscopy (STEM) is providing previously unattainable views of materials at the atomic scale. The quality of STEM data is now often…
  • The 16th European Microscopy Congress 2016

    Progress in analysing lithium ion battery materials in the SEM

    Christian Lang (1), Andy Naylor (2), Felix Richter (2), Christoph Birkl (3), Stefanie Zekoll (2), Simon Burgess (4), Gareth Hughes (2), David Howey (3), Peter G. Bruce (2)

    1. Oxford Instruments, High Wycombe, Royaume Uni 2. Department of Materials, University of Oxford, Oxford, Royaume Uni 3. Department of Engineering Science, University of Oxford, Oxford, Royaume Uni 4. Nanoanalysis, Oxford Instruments, High Wycombe, Royaume Uni

    New and existing materials for lithium ion batteries are being studied extensively with the aim of increasing their storage capacity and lifetime. While the SEM…
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