The 16th European Microscopy Congress 2016
Microstructural and mechanical properties of hyper-deformed surfaces: In-situ micro-pillar compression and EBSD investigations in α-iron
The mechanical surface treatments confer better local mechanical properties against wear or fatigue service conditions. In the case of impact-based treatments, a local microstructure refinement…The 16th European Microscopy Congress 2016
Correlative SEM techniques for resolving complex microstructure of CoCrFeNiZrx High Entropy Alloys
High-entropy alloys (HEAs) introduce a new concept of developing advanced metallic materials with properties that conventional alloys, based on one principal element, cannot achieve [1].…The 16th European Microscopy Congress 2016
Transmission Kikuchi Diffraction: effective nano-scale analysis using conventional EBSD hardware
1. Oxford Instruments, High Wycombe, Royaume Uni 2. Oxford Instruments, Paris, France
SEM-based Transmission Kikuchi Diffraction (SEM-TKD) [1,2] is an extension to the conventional technique of reflection EBSD (using bulk samples) to transmision EBSD using thin samples. …The 16th European Microscopy Congress 2016
Microstructure Analysis of Transient Liquid Phase Bonded Joints with Sn based Rapidly Solidified Braze Ribbons
Transient liquid phase (TLP) bonding is a diffusion based joining process that has been applied to different metallic systems. It is based on diffusion of…The 16th European Microscopy Congress 2016
Addressing Pseudo-Symmetric Misindexing in EBSD Analysis of gamma -TiAl with High Accuracy Band Detection
Technological developments in EBSD has enabled great improvements in indexing reliability and accuracy [1]. However, some individual phases continue to pose challenges, especially those that…The 16th European Microscopy Congress 2016
Adiabatic shear loading in thermal spray coatings studied by EBSD
A basic principle during the formation of thermal spray coatings is the phenomenon of “adiabatic shear instability” which influences splat formation, bonding or oxidation of…The 16th European Microscopy Congress 2016
SILICON CARBIDE 3C IDENTIFICATION BY THE NEW DEVELOPED NORDIF EBSD EXTRACTION SOFTWARE
Electron backscatter diffraction (EBSD) is a powerful tool to automatically and quantitatively characterize the orientation of grains and phases of ceramic…The 16th European Microscopy Congress 2016
Multiphase material sample preparation using broad-beam Ar ion milling for EBSD analyses
1. E. A. Fischione Instruments, Inc., Export, Etats-Unis
When compared to monophase materials, multiphase materials can offer an improvement in properties or introduce new properties. For example, tungsten, carbides, and nitrides do not…The 16th European Microscopy Congress 2016
Dark-Field Imaging with Electron Backscatter Diffraction Patterns
1. Materials Engineering, McGill University, Montreal, Canada
Dark-field (DF) imaging can be performed by selecting a specific diffracted beam in the selected area diffraction pattern in conventional transmission electron microscope (CTEM) or…The 16th European Microscopy Congress 2016
Interface migration mechanism on Corundum/Spinel/Periclase: atomic study via aberration-corrected STEM
In nature it is common that a new mineral grows between two minerals due to the inter-diffusion of elements. Understanding its growth mechanism is critical…
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