The 16th European Microscopy Congress 2016
Cathodoluminescence and EBIC study of widegap semiconductors and devices
Cathodoluminescence (CL) and electron-beam-induced current (EBIC) are versatile techniques to characterize semiconductor materials and devices. In this talk, we review our achievement on the study…The 16th European Microscopy Congress 2016
SEM based electro-optical characterization of core-shell LEDs and simulation of imaging including CL and EBIC excitation inside ensembles
Three dimensional (3D) nano- and microstructures (NAMs) are attracting a lot of attention and are discussed regarding several applications, especially in optoelectronics and sensors. For…
Official abstracts site for the European Microscopy Congress