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Articles tagged "EBIC"

  • The 16th European Microscopy Congress 2016

    Cathodoluminescence and EBIC study of widegap semiconductors and devices

    Takashi Sekiguchi (1)

    1. International Center for Materials Nanoarchitectonics (MANA), National Institute for Materials Science, Tsukuba, Japon

    Cathodoluminescence (CL) and electron-beam-induced current (EBIC) are versatile techniques to characterize semiconductor materials and devices. In this talk, we review our achievement on the study…
  • The 16th European Microscopy Congress 2016

    SEM based electro-optical characterization of core-shell LEDs and simulation of imaging including CL and EBIC excitation inside ensembles

    Johannes Ledig (1), Carl Georg Frase (2), Frederik Steib (1), Jana Hartmann (1), Hergo-Heinrich Wehmann (1), Andreas Waag (1)

    1. Institute of Semiconductor Technology and Laboratory for Emerging Nanometrology, TU Braunschweig, Braunschweig, Allemagne 2. AG 5.24 Modellierung Rastermikroskopie, Physikalisch-Technische Bundesanstalt, Braunschweig, Allemagne

    Three dimensional (3D) nano- and microstructures (NAMs) are attracting a lot of attention and are discussed regarding several applications, especially in optoelectronics and sensors. For…

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