The 16th European Microscopy Congress 2016
Three-dimensional electron imaging of dislocations from a single sample tilt
Linear crystal defects called dislocations are one of the most fascinating concepts in materials science that govern mechanical and optoelectronic properties of many materials across…The 16th European Microscopy Congress 2016
In-situ deformation of Ti6Al4V in electron microscopes
1. School of Metallurgy and Materials, University of Birmingham, Birmingham, Royaume Uni
Ti6Al4V is the most widely used titanium alloy [1] and comprises two phases, viz. a hexagonally closely packed α phase and a body centred cubic…The 16th European Microscopy Congress 2016
Dislocation and microstructure analysis of tungsten
The demand for neutron scattering and imaging techniques for material characterization under controlled conditions is continuously growing over the last couple of years. For such…The 16th European Microscopy Congress 2016
HRTEM investigation of dislocation/hydrogen interaction mechanisms in hydrided nanocrystalline palladium films
Thin Pd membranes constitute an enabling material in hydrogen permeation and sensing applications. During hydriding of Pd, as long as the H/Pd (atomic ratio) stays…The 16th European Microscopy Congress 2016
Cathodoluminescence and EBIC study of widegap semiconductors and devices
Cathodoluminescence (CL) and electron-beam-induced current (EBIC) are versatile techniques to characterize semiconductor materials and devices. In this talk, we review our achievement on the study…
Official abstracts site for the European Microscopy Congress