The 16th European Microscopy Congress 2016
Optimization of NBED simulations to accurately predict disc-detection measurements
1. Institute of Solid State Physics, University of Bremen, Bremen, Allemagne
Scanning TEM (STEM) in combination with a small convergence angle (nano-beam electron diffraction, NBED) can be used, e.g., to determine the local strain state of…
Official abstracts site for the European Microscopy Congress