The 16th European Microscopy Congress 2016
Atom-Resolved STEM Imaging Using a Segmented Detector
In scanning transmission electron microscopy (STEM), differential phase contrast (DPC) imaging has been developed to visualize the local electromagnetic field distribution in materials…The 16th European Microscopy Congress 2016
Direct determination of calibration factors for quantitative DPC measurements
1. Institute of Experimental and Applied Physics, University of Regensburg, Regensburg, Allemagne
Differential phase contrast microscopy (DPC) is a measurement technique which is utilized in a scanning transmission electron microscope (STEM) equipped with a special direction sensitive…The 16th European Microscopy Congress 2016
Direct comparison of differential phase contrast and off-axis electron holography for the measurement of electric potentials by the examination of reverse biased Si p-n junctions and III-V samples.
In this presentation we will compare differential phase contrast (DPC) [1] and off-axis electron holography [2] for the measurement of electrostatic potentials in semiconductor devices.…The 16th European Microscopy Congress 2016
DPC measurements on annealed cobalt thin films
1. Institute of Experimental and Applied Physics, University of Regensburg, Regensburg, Allemagne
In this work we present the results of differential phase contrast (DPC) [1,2] measurements of micro magnetic field distributions in annealed cobalt thin films. The…
Official abstracts site for the European Microscopy Congress