The 16th European Microscopy Congress 2016
ColorSTEM – A Novel STEM Detector for Advanced Materials Analysis in SEM
Performing scanning transmission electron microscopy (STEM) in a scanning electron microscope (SEM) is a popular technique for laboratories without transmission electron microscopy (TEM) capabilities. The…The 16th European Microscopy Congress 2016
3D surface reconstruction with segmented BSE detector: New improvements and application for fracture analysis in SEM
Using the signals of four backscattered electron (BSE) detectors with different detection angles in the scanning electron microscope (SEM) the three-dimensional surface topography of various…
Official abstracts site for the European Microscopy Congress