The 16th European Microscopy Congress 2016
Probing localized strain in solution-derived YBCO nanocomposite films
The investigation of the atomic structure of individual defects is critical to the understanding andprecise controlling of the physical properties of materials. And although defects…The 16th European Microscopy Congress 2016
Effects of electron-beam-generated anion point defects on the long range order of charge density waves in 1T-TaSe2, 1T-TaS2
Charge density waves (CDW) are periodic modulations of charge density in low-dimensional metals observed as a function of temperature, doping and pressure. Due to electron-phonon…The 16th European Microscopy Congress 2016
Investigating Cu diffusion in CdTe solar cells via aberration-corrected STEM: Cu2-xTe precipitates at CdTe twins and the CdTe/CdS interface
CdTe is one of the most promising materials for thin film solar cells due to its near-optimum bandgap, high efficiency and low cost of fabrication.…The 16th European Microscopy Congress 2016
TEM analysis of stress induced defects in baddeleyite xenocrysts from the Phalaborwa complex
1. Centre for HRTEM, Nelson Mandela Metropolitan University, Port Elizabeth, Afrique du Sud
Large deposits of baddeleyite (natural zirconia) were found in the Phalaborwa complex and mainly in the foskorite ore zone and to a lesser extent in…The 16th European Microscopy Congress 2016
ATOM-PROBE TOMOGRAPHY AND NANOSCIENCES
1. GPM, Normandie Université, Rouen, France 2. LETI, CEA, Grenoble, France
The design of Atom probe tomography (APT) at Oxford and Rouen universities 25 years ago has been an outstanding breakthrough in the microscopy world. APT…The 16th European Microscopy Congress 2016
In situ TEM electrical biasing studies on defect based crystal-amorphous transformation in GeTe nanowire devices
Germanium telluride (GeTe), a phase-change material, switches rapidly and reversibly between crystalline and amorphous phase. The crystalline to amorphous transformation pathway is based on melting…The 16th European Microscopy Congress 2016
Transmission electron microscopy study of defects generated during chemical vapor deposition diamond lateral growth
Synthetic diamond is one of the most promising materials for high power devices due to its extraordinary physical properties, such as high thermal conductivity (22…
Official abstracts site for the European Microscopy Congress