The 16th European Microscopy Congress 2016
Using a simplified in line holography method as a qualitative tool to detect local heterogeneities in HfO2 layers
Oxygen vacancies in high-k oxides are foreseen to have detrimental effects in devices like high-k metal gate MOS transistors [1] and beneficial ones in RRAM…The 16th European Microscopy Congress 2016
Analysis of white-luminescent mesoporous carbonized silica under electron irradiation by TEM-CL system
1. Nagoya Univ., Nagoya, Japon 2. JFCC, Nagoya, Japon 3. Nagoya Inst. Tech., Nagoya, Japon
Mesoporous carbonized silica (MPCS) exhibits continuous white photoluminescence (PL) like the solar emission spectrum [Fig.1 (a)], which attracts attention as a new luminescent material,…
Official abstracts site for the European Microscopy Congress