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Articles tagged "damage mechanisms"

  • The 16th European Microscopy Congress 2016

    Quantitative low-voltage spherical and chromatic aberration-corrected high-resolution TEM analysis of beam-specimen interactions in single-layer MoS2 and MoS2/graphene heterostructures

    Tibor Lehnert (1), Johannes Biskupek (1), Janis Köster (1), Martin Linck (2), Ute Kaiser (1)

    1. Electron Microscopy Group of Materials Science, Ulm University, 89081 Ulm, Allemagne 2. CEOS GmbH, 69126 Heidelberg, Allemagne

    Sub-Angstrom resolution at medium accelerating voltages of 200-300 kV is routinely achieved in standard transmission electron microscopes by hardware correction of the spherical aberration of…

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