The 16th European Microscopy Congress 2016
Quantitative low-voltage spherical and chromatic aberration-corrected high-resolution TEM analysis of beam-specimen interactions in single-layer MoS2 and MoS2/graphene heterostructures
Sub-Angstrom resolution at medium accelerating voltages of 200-300 kV is routinely achieved in standard transmission electron microscopes by hardware correction of the spherical aberration of…
Official abstracts site for the European Microscopy Congress